Publications

 

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2020

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2019

Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer

M.-Y. Wu, K. Le Guen, J.-M. André, P. Jonnard, I. Vickridge, D. Schmaus, E. Briand, P. Walter, Q.-S. Huang, Z.-S. Wang

NIM B450, 252-256 (2019) (https://doi.org/10.1016/j.nimb.2018.08.008)

https://hal.archives-ouvertes.fr/hal-02162011v1

 

Kossel effect in periodic multilayers

K. Le Guen, J.-M. André, M.Y. Wu, V. Ilakovac, F. Delmotte, S. de Rossi, F. Bridou, E. Meltchakov, A. Giglia, S. Nannarone, Z.-S. Wang, Q.-S. Huang, Z. Zhang, J.-T. Zhu, Y.-C. Tu, Y.-Y. Yuan, I. Vickridge, D. Schmaus, E. Briand, S. Steydli, P. Walter, P. Jonnard

J. Nanosci. Nanotechnol. 19, 593-601 (2019) (https://dx.doi.org/10.1166/jnn.2019.16472)

https://hal.archives-ouvertes.fr/hal-01909419

 

Impact of KF-post deposition treatment on Cu(In,Ga)Se2 surface and Cu(In,Ga)Se2/CdS interface sulfurization

S. Harel, P. Jonnard, T. Lepetit, L. Arzel, N. Barreau

Appl. Surf. Sci. 473, 1062-1065 (2019) (https://doi.org/10.1016/j.apsusc.2018.12.062)

https://hal.archives-ouvertes.fr/hal-01990439

 

Kossel interferences of proton-induced X-ray emission lines to study thin film waveguides

J.-P. Zhang, C. Pendenque, K. Le Guen, R. Delaunay, I. Vickridge, D. Schmaus, Q.-G. Fu, P. Jonnard

NIM B452, 12-20 (2019) (https://doi.org/10.1016/j.nimb.2019.05.053)

https://hal.archives-ouvertes.fr/hal-02142094

 

Structure and optical properties of CrOxNy films with composition modulation

Y.-Y. Yuan, B.-Y. Zhang, J. Sun, P. Jonnard, K. Le Guen, Y.-C. Tu, C. Yan, R. Lan

Surface Engineering (2019), sous presse (https://doi.org/10.1080/02670844.2019.1656356)

 

Characterization of Mg/Sc multilayers with and without Co barriers layers for x-ray spectroscopy in the water window range

P. Jonnard, M.-Y. Wu, K. Le Guen, A. Giglia, K. Koshmak, Q.-S. Huang, Z. Zhang, Z.-S. Wang, I. Estève, N. Menguy, B. Doisneau

J. Appl. Phys. 126. 195301 (2019) (https://doi.org/10.1063/1.5128867)

https://hal.archives-ouvertes.fr/hal-02375696v1

 


2018

Evolution of interfacial structure of Co-based periodic multilayers upon annealing

Y.-Y. Yuan, K. Le Guen, C. Mény, C. Ulhaq-Bouillet, J.-T. Zhu, Z.-S. Wang, P. Jonnard

Surf. Coat. Technol. 352, 508-512 (2018) (https://doi.org/10.1016/j.surfcoat.2018.08.054)

https://hal.sorbonne-universite.fr/hal-01876410

 

Characterization of Pd/Y multilayers with B4C barrier layers using GIXR and x-ray standing wave enhanced HAXPES

M.-Y. Wu, Q.-S. Huang, K. Le Guen, V. Ilakovac, B.-X. Li, Z.-S. Wang, A. Giglia, J.-P. Rueff, P. Jonnard

J. Sync. Rad. 25, 1417-1424 (2018) (https://doi.org/10.1107/S1600577518009402)

https://hal.sorbonne-universite.fr/hal-01876424                   https://arxiv.org/abs/1809.10986

 

Depth analysis of Al/ZrC interfaces using SIMS and x-ray reflectivity techniques

M.H. Modi, M. Sinha, A. Bose, A. Singh, P. Jonnard

Surf. Interf. Anal. 50, 1239-1242 (2018) (http://dx.doi.org/10.1002/sia.6443)

https://hal.archives-ouvertes.fr/hal-01919286

 

Study of the Au-Cr bilayer system using x-ray reflectivity, GDOES and ToF-SIMS

P. Jonnard, M. H. Modi, K. Le Guen, N. Aneshwari, M. Sinha, M. Idir, P. Chapon, A. Galtayries

Surf. Interf. Anal. 50, 1213-1217 (2018) (http://dx.doi.org/10.1002/sia.6445)

https://hal.archives-ouvertes.fr/hal-01919823

 

Soft x-ray characterization of ion beam sputtered magnesium oxide (MgO) thin film

M. Sinha, M. Gupta, M.H. Modi, P. Jonnard

Surf. Interf. Anal. 50, 1145-1148 (2018) (http://dx.doi.org/10.1002/sia.6446)

 

Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer

P. Jonnard, M.-Y. Wu, J.-M. André, K. Le Guen, Z.-S. Wang, Q.-S. Huang, I. Vickridge, D. Schmaus, E. Briand, S. Steydli, P. Walter

Rev. Sci. Instrum. 89, 096109 (2018) (https://doi.org/10.1063/1.5040980)

https://hal.archives-ouvertes.fr/hal-01882729v1                   https://arxiv.org/abs/1809.10989


2017

X-ray absorption spectroscopy study of buried Co layers in the Co/Mo2C multilayer mirrors
Y.-Y. Yuan, K. Le Guen, Y.-C. Tu, J.-T. Zhu, Z.-S. Wang, W.-B. Li, M.-W. Wen, C. Meny, H.-S. Yu, Y.-X. Huang, X.-J. Wei, P. Jonnard
Surf. Interf. Anal. 49, 205-209 (2017) (http://dx.doi.org/10.1002/sia.6116)
http://hal.archives-ouvertes.fr/hal-01480541


Ultra-short and ultra-intense x-ray free-electron laser single pulse in one-dimensional photonic crystals
J.-M. André, P. Jonnard
J. Sync. Rad. 24, 376-385 (2017) (https://doi.org/10.1107/S1600577517000820)
http://hal.upmc.fr/hal-01474782v1


Investigation of ZrC/Al interfaces in a Al/ZrC/Al/W waveguide-like structure by soft x-ray reflectivity technique
A. Singh, M. H. Modi, P. Jonnard, K. Le Guen and J.-M. André.
J. Elec. Spectrosc. Rel. Phenom. 220, 6-8 (2017) (https://doi.org/10.1016/j.elspec.2017.03.002)


Nitridated Pd/B4C multilayer mirrors for soft X-ray region: internal structure and aging effects
Y.-W. Wang, Q.-S. Huang, Q. Yi, I. V. Kozhevnikov, R.-Z. Qi, M.-W. Wen, P. Jonnard, J.-S. Zhang, A. Giglia, Z. Zhang, Z.-S. Wang
Opt. Exp. 25, 7749-7760 (2017) (https://doi.org/10.1364/OE.25.007749)


Design, development and applications of etched multilayers for soft x-ray spectroscopy
K. Le Guen, R. Benbalagh, J.-M. André, J.-R. Coudevylle, P. Jonnard
Eur. Phys. J. Appl. Phys. 78, 20702 (2017) (https://doi.org/10.1051/epjap/2017160287)
https://hal.archives-ouvertes.fr/hal-01527456v1


EUV stimulated emission from MgO pumped by FEL pulses
P. Jonnard, J.-M. André, K. Le Guen, M.-Y. Wu, E. Principi, A. Simoncig, A. Gessini, R. Mincigrucci, C. Masciovecchio, O. Peyrusse
Struc. Dyn. 4, 054306 (2017) (http://dx.doi.org/10.1063/1.4993293)
https://hal.archives-ouvertes.fr/hal-01664322v1
Featured by the editor


Thermal and temporal stability of V/Sc multilayer mirror for the soft X-ray water window region
Q. Yi, Q.-S. Huang, J.-S. Zhang, X.-M. Wang, R.-Z. Qi, Z. Zhang, T.-P. Peng, P. Jonnard, A. Giglia, Z.-S. Wang
Vacuum 146, 187-193 (2017) (https://doi.org/10.1016/j.vacuum.2017.09.030)


Modeling of the interaction of an XFEL with large finite samples
O. Peyrusse, J.-M. André, P. Jonnard, J. Gaudin
Phys. Rev. E96, 043205 (2017) (https://doi.org/10.1103/PhysRevE.96.043205)
https://hal.archives-ouvertes.fr/hal-01344717


High reflectance nanoscale V/Sc multilayer for soft x-ray water window region
Q.-S. Huang, Q. Yi, Z.-D. Cao, R.-Z. Qi, R. Loch, P. Jonnard, M.-Y. Wu, A. Giglia, W.-B. Li, E. Louis, F. Bijkerk, Z. Zhang, Z.-S. Wang
Sci. Rep. 7, 12929 (2017) (https://doi.org/10.1038/s41598-017-13222-5)


Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave enhanced x-ray fluorescence
M.-Y. Wu, C. Burcklen, J.-M. André, K. Le Guen, A. Giglia, K. Koshmak, S. Nannarone, F. Bridou, E. Meltchakov, S. de Rossi, F. Delmotte, P. Jonnard
Opt. Eng. 56, 117101 (2017) (http://dx.doi.org/10.1117/1.OE.56.11.117101)
https://hal.archives-ouvertes.fr/hal-01630278


2016

Time-dependent Bragg diffraction by multilayer gratings

J.-M. André, P. Jonnard

J. Opt. 18, 015603 (2016) (http://dx.doi.org/10.1088/2040-8978/18/1/015603)

http://hal.archives-ouvertes.fr/hal-01233488                       https://arxiv.org/abs/1511.08094


High reflectance Cr/V multilayer with B4C barrier layer for water window wavelength region

Q.-S. Huang, J.-N. Fei, Y. Liu, P. Li, M.-W. Wen, P. Jonnard, A. Giglia, Z. Zhang, K. Wang, Z.-S. Wang

Opt. Lett. 41, 701-704 (2016) (http://dx.doi.org/10.1364/OL.41.000701)


Kossel interferences of proton-induced x-ray emission lines in periodic multilayers

M.-Y. Wu, K. Le Guen, J.-M. André, V. Ilakovac, I. Vickridge, D. Schmaus, C. Burcklen, F. Bridou, E. Meltchakov, S. de Rossi, F. Delmotte, P. Jonnard

Nucl. Instrum. Meth. Phys. Res. B386, 39-43 (2016) (http://dx.doi.org/10.1016/j.nimb.2016.09.014)

http://hal.archives-ouvertes.fr/hal-01374375                       https://arxiv.org/abs/1612.02140


Cr/Sc multilayer radiator for parametric EUV radiation in “water-window” spectral range

S. R. Uglov, V. V. Kaplin, A. S. Kubankin, J.-M. André, K. Le Guen, P. Jonnard, S. de Rossi, E. Meltchakov, F Delmotte

J. Phys. Conf. Ser. 732, 012017 (2016) (http://dx.doi.org/10.1088/1742-6596/732/1/012017)

 


2015

Inter-laboratory comparison of a WDS-EDS analysis of a metallic glass

P. Jonnard, F. Brisset, F. Robaut, G. Wille, J. Ruste

X-Ray Spectrom. 44, 24-29 (2015) (http://dx.doi.org/10.1002/xrs.2573)

http://hal.archives-ouvertes.fr/hal-01188759                       https://arxiv.org/abs/1509.00261


Interface observation of heat-treated Co/Mo2C multilayer

Y.-Y. Yuan, K. Le Guen, J.-M. André, C. Mény, C. Ulhaq, A. Galtayries, J.-T. Zhu, Z.-S. Wang, P. Jonnard

Appl. Surf. Sci. 331, 8-16 (2015) (http://dx.doi.org/10.1016/j.apsusc.2014.12.055)

http://hal.archivesouvertes.fr/hal-01110582             http://arxiv.org/abs/1501.07360


Time-dependent Bragg diffraction and short-pulse reflection by one-dimensional photonic crystals

J.-M. André, P. Jonnard

J. Opt. 17, 085609 (2015) (http://dx.doi.org/10.1088/2040-8978/17/8/085609)

http://hal.archives-ouvertes.fr/hal-01114371                        https://arxiv.org/abs/1509.00263


Kossel diffraction and photonic modes in one-dimensional photonic crystal

J.-M. André, P. Jonnard, K. Le Guen, F. Bridou

Phys. Scr. 90, 085503 (2015) (http://dx.doi.org/10.1088/0031-8949/90/8/085503)

http://hal.archives-ouvertes.fr/hal-01188789                       https://arxiv.org/abs/1509.00281


X-ray fluorescence induced by standing waves in the grazing incidence and grazing exit modes: study of the Mg-Co-Zr system

Y.-C. Tu, Y.-Y. Yuan, K. Le Guen, J.-M. André, J.-T. Zhu, Z.-S. Wang, F. Bridou, A. Giglia, P. Jonnard

J. Sync. Rad. 22, 1419-1425 (2015) (http://dx.doi.org/10.1107/S1600577515016239)

http://hal.archives-ouvertes.fr/hal-01224951                       https://arxiv.org/abs/1511.01739


Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors

D.-C. Xu, Q.-S. Huang, Y.-W. Wang, P. Li, M.-W. Wen, P. Jonnard, A. Giglia, I. V. Kozhevnikov, Z. Zhang, Z.-S. Wang

Opt. Exp. 23, 33018-33026 (2015) (http://dx.doi.org/10.1364/OE.23.033018)


2014

X-ray quasi-lamellar etched multilayers: analysis by coupled-mode theory

J.-M. André, K. Le Guen, P. Jonnard

X-Ray Spectrom. 43, 122-125 (2014) (http://dx.doi.org/10.1002/xrs.2526)

http://hal.archives-ouvertes.fr/hal-00945900


Co/Mo2C multilayer as x-ray mirror: optical and thermal performances

Y.-Y. Yuan, K. Le Guen, J.-M. André, Z.-S. Wang, H.-C. Li, J.-T. Zhu, C. Mény, A. Giglia, S. Nannarone P. Jonnard

Phys. Stat. Sol. B251, 803-808 (2014) (http://10.1002/pssb.201350082)

http://hal.archives-ouvertes.fr/hal-01253622


Structural changes induced by thermal annealing in Cr/C multilayers

Y.-C. Tu, J.-T. Zhu, H.-C. Li, P. Jonnard, K. Le Guen, H. Chen, Z.-S. Wang

Appl. Surf. Sci. 313, 341-345 (2014) (http://dx.doi.org/10.1016/j.apsusc.2014.05.212)


Feasibility considerations of a soft-x-ray distributed feedback laser pumped by an X-FEL

J.-M. André, K. Le Guen, P. Jonnard

Laser Phys. 24, 085001 (2014) (http://dx.doi.org/10.1088/1054-660X/24/8/085001)

http://hal.archives-ouvertes.fr/hal-01011251                       http://arxiv.org/abs/1406.6001


Spontaneous x-ray fluorescence from a superlattice under Kossel diffraction conditions

P. Jonnard, Y.-Y. Yuan, K. Le Guen, J.-M. André, J.-T. Zhu, Z.-S. Wang, F. Bridou

J. Phys. B47, 165601 (2014) (http://dx.doi.org/10.1088/0953-4075/47/16/165601)

http://hal.archives-ouvertes.fr/hal-01058829


Optical and structural characterization of the Co/Mo2C/Y system

Y.-Y. Yuan, K. Le Guen, J.-M. André, Z.-S. Wang, J.-T. Zhu, C. Mény, P. Jonnard

Appl. Surf. Sci. 315, 499-505 (2014) (http://dx.doi.org/10.1016/j.apsusc.2014.03.176)

http://hal.archives-ouvertes.fr/hal-01065948


Thermal stability of Co/C multilayers

J.-T. Zhu, Y.-C. Tu, Y.-Y. Yuan, Z.-X. Feng, Y.-Z. Zhang, P. Jonnard, C. Mény, K. Le Guen, J.-M. André, Z.-S. Wang

Mat. Res. Exp. 1, 046503 (2014) (http://dx.doi.org/10.1088/2053-1591/1/4/046503)

http://hal.archives-ouvertes.fr/hal-01238002


2013

Characterization of multilayers and their interlayers: application to Co-based systems

P. Jonnard, Z.-S. Wang, J.-T. Zhu, C. Mény, J.-M. André, M.-H. Hu, K. Le Guen

Chin. Opt. Lett. 11(S1), S10601 (2013) (http://dx.doi.org/10.3788/COL201311.S10601)

http://hal.archivesouvertes.fr/hal-01100238


Zr/Mg multilayer mirror for extreme ultraviolet application and its thermal stability

H.-C. Li, J.-T. Zhu, S.-K. Zhou, Z.-S. Wang, H. Chen, P. Jonnard, K. Le Guen, J.-M. André

Appl. Phys. Lett. 102, 111103 (2013) (http://dx.doi.org/10.1063/1.4794399)


Oscillating dipole model for the x-ray standing wave enhanced fluorescence in periodic multilayers

J.-M. André, K. Le Guen, P. Jonnard

Spectrochimica Acta B85, 55-61 (2013) (http://dx.doi.org/10.1016/j.sab.2013.03.012)

http://hal.archives-ouvertes.fr/hal-00832205                       https://arxiv.org/abs/1306.2431


The transition from amorphous to crystalline in Al/Zr multilayers

Q. Zhong, Z. Zhang, S. Ma, R. Qi, J. Li, Z.-S. Wang, K. Le Guen, J.-M. André, P. Jonnard

J. Appl. Phys. 113, 133508 (2013) (http://dx.doi.org/10.1063/1.4799013)

http://hal.archives-ouvertes.fr/hal-00757458                       https://arxiv.org/abs/1211.6301


Thermally-induced structural modification in the Al/Zr multilayers

Q. Zhong, S. Ma, Z. Zhang, R. Qi, J. Li, Z.-S. Wang, K. Le Guen, J.-M. André, P. Jonnard

Appl. Surf. Sci. 279, 334-342 (2013) (http://dx.doi.org/10.1016/j.apsusc.2013.04.094)

http://hal.archives-ouvertes.fr/hal-00744814                        https://arxiv.org/abs/1210.6442


Enhancement of the reflectivity of Al(1%wtSi)/Zr multilayers by a novel structure

Q. Zhong, Z. Zhang, R.-Z. Qi, J. Li, Z.-S. Wang, K. Le Guen, J.-M. André, P. Jonnard

Opt. Express 21, 14399-14408 (2013) (http://dx.doi.org/10.1364/OE.21.014399)

http://hal.archives-ouvertes.fr/hal-00767508


Optical performance, structure and thermal stability of Al(1wt.-%Si)/Zr and Al(pure)/Zr multilayers designed for the 17–19 nm range

Q. Zhong, W.-B. Li, Z. Zhang, J.-T. Zhu, Q.-S. Huang, H.-C. Li, Z.-S. Wang, P. Jonnard, K. Le Guen, Y.-Y. Yuan, J.-M. André, H.-J. Zhou, T.-L. Huo

Chin. Opt. Lett. 11(S1), S10603 (2013) (http://dx.doi.org/10.3788/COL201311.S10603)

http://hal.archivesouvertes.fr/hal-01100238



Photonic bandgaps of periodic multilayers with diffuse interfaces

J.-M. André, P. Jonnard

JOSA B30, 2296-2300 (2013) (http://dx.doi.org/10.1364/JOSAB.30.002296)

http://hal.archives-ouvertes.fr/hal-00854489


Co/Mo2C mirror as studied by x-ray fluorescence and photoelectron spectroscopies induced by x-ray standing waves

P. Jonnard, K. Le Guen, Y.-Y. Yuan, J.-M. André, S. Mukherjee, A. Giglia, S. Nannarone, N. Mahne, Z.-S. Wang, H.-C. Li, J.-T. Zhu

Proc. SPIE 8550, 85501D (2013) (http://dx.doi.org/10.1117/12.980893)


Determination of the magnetization profile of Co/Mg periodic multilayers by magneto-optic Kerr effect and X-ray magnetic resonant reflectivity

P. Jonnard, K. Le Guen, J.-M. André, R. Delaunay, N. Mahne, A. Giglia, S. Nannarone, A. Verna, Z.-S. Wang, J.-T. Zhu, S.-K. Zhou

J. Phys. Conf. Ser. 417, 012025 (2013) (http://dx.doi.org/10.1088/1742-6596/417/1/012025)

http://hal.archives-ouvertes.fr/hal-00801971                       http://fr.arxiv.org/abs/1303.4380


Analyse par la théorie des ondes couplées de la diffraction par des réseaux multicouches dans le domaine X

J.-M. André, K. Le Guen, P. Jonnard

UVX2012, 02001 (2013) (http://dx.doi.org/10.1051/uvx/201302001)


Al/Zr multilayer mirror and its thermal stability for EUV application

Q. Zhong, Z. Zhang, W.-B. Li, J.-T. Zhu, Z.-S. Wang; P. Jonnard, K. Le Guen, Y.-Y. Yuan, J.-M. André, H.-J. Zhou, T.-L. Huo

J. Phys. Conf. Ser. 425, 152010 (2013) (http://10.1088/1742-6596/425/15/152010)


Investigation of the x-ray reflectivity of the Co/Mo2C system upon thermal treatment

Y.-Y. Yuan, K. Le Guen, J.-M. André, Z.-S. Wang, J.-T. Zhu, P. Jonnard

Proc. SPIE 8550, 85501U (2013) (http://dx.doi.org/10.1117/12.980895)


2012

Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications

M.-H. Hu, K. Le Guen, J.-M. André, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, C. Meny, N. Mahne, A. Giglia, S. Nannarone, I. Estève, M. Walls, P. Jonnard

Appl. Phys. A106, 737-745 (2012) (http://dx.doi.org/10.1007/s00339-011-6681-9)

http://hal.archives-ouvertes.fr/hal-00648899                        http://arxiv.org/abs/1112.1292


Influence of working gas pressure on the performance of W/Si multilayers

F.-F. Wang, J.-T. Zhu, Q. Zhong, Z.-S. Wang, P. Jonnard, K. Le Guen, J.-M. André, M. Fialin

Chin. Phys. C36, 909-914 (2012) (http://dx.doi.org/10.1088/1674-1137/36/9/021)


An etched multilayer as a dispersive element in a curved-crystal spectrometer: implementation and performance

P. Jonnard, K. Le Guen, J.-M. André, J.-R. Coudevylle, N. Isac

X-Ray Spectrom. 41, 308-312 (2012) (http://dx.doi.org/10.1002/xrs.2398)

http://hal.archives-ouvertes.fr/hal-00725539                       http://arXiv.org/abs/1208.6404


Optical and structure performance of the Al/Zr reflection multilayers in the 17–19nm region

Q. Zhong, W.-B Li, Z. Zhang, J.T. Zhu, Q.-S. Huang, H.C. Li, Z.-S. Wang, P. Jonnard, K. Le Guen, J.-M. André, H.-J. Zhou, T.-L. Huo

Opt. Express 20, 10692-10700 (2012) (http://dx.doi.org/10.1364/OE.20.010692)

http://hal.archives-ouvertes.fr/hal-00685910


The chemical characterization and reflectivity of the Al/Zr periodic multilayer

Q. Zhong, Z. Zhang, J.-T. Zhu, Z.-S. Wang, P. Jonnard, K. Le Guen, J.-M. André

Appl. Surf. Sci. 259, 371-375 (2012) (http://dx.doi.org/10.1016/j.apsusc.2012.07.054)

http://hal.archives-ouvertes.fr/hal-00697730


The thermal stability of Al(1%wtSi)/Zr EUV mirrors

Q. Zhong, Z. Zhang, J.-T. Zhu, Z.-S. Wang, H. Chen, P. Jonnard, K. Le Guen, Y.-Y. Yuan, J.-M. André, H.-J. Zhou, T.-L. Hu

Appl. Phys. A109, 133-138 (2012) (http://dx.doi.org/10.1007/s00339-012-7085-1)


The TPLUS project : a table-top tunable parametric UV radiation source

J.-M. André, G. Turk, K. Le Guen, P. Jonnard, F. Delmotte, S. de Rossi, A. Jérôme, A.-L. Coutrot

J. Phys. Conf. Ser. 357, 012039 (2012) (http://dx.doi.org/10.1088/1742-6596/357/1/012039)

http://hal.archives-ouvertes.fr/hal-00748799


2011

Introduction of Zr layers in periodic Mg/Co multilayers

K. Le Guen, M.-H. Hu, J.-M. André, P. Jonnard, S. K. Zhou, H. C. Li, J. T. Zhu, Z. S. Wang, N. Mahne, A. Giglia, S. Nannarone

Appl. Phys. A102, 69-77 (2011) (http://dx.doi.org/10.1007/s00339-010-6093-2)

http://hal.archives-ouvertes.fr/hal-00642789/fr/        http://arxiv.org/abs/1111.4546


Cauchois & Sénémaud Tables of wavelengths of x-ray emission lines and absorption edges

P. Jonnard, C. Bonnelle

X-Ray Spectrom. 40, 12-16 (2011) (http://dx.doi.org/10.1002/xrs.1293)

http://hal.archives-ouvertes.fr/hal-00596480/fr/              http://arxiv.org/abs/1112.1182


Characterization of EUV periodic multilayers

K. Le Guen, M.-H Hu, J.-M. André, P. Jonnard, Z. Wang, J. Zhu, A. Galtayries, C. Meny, E. Meltchakov, C. Hecquet, F. Delmotte

X-Ray Spectrom. 40, 338-342 (2011) (http://dx.doi.org/10.1002/xrs.1350)

http://hal.archives-ouvertes.fr/hal-00642782/fr/


Origin of step-like behavior in Co/Si system

A. Sagdeo, S. Rai, A. K. Srivastava, G. S. Lodha, R. Rawat, K. Le Guen, P. Jonnard

J. Phys. Cond. Matter 23, 246004 (2011) (http://dx.doi.org/10.1088/0953-8984/23/24/246004)


Observation of an asymmetrical effect when introducing Zr in Mg/Co multilayers

K. Le Guen, M.-H. Hu, J.-M. André, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, C. Meny, A. Galtayries, P. Jonnard

Appl. Phys. Lett. 98, 251909 (2011) (http://dx.doi.org/10.1063/1.3601859)

http://hal.archives-ouvertes.fr/hal-00642773/fr/


Molybdenum-silicon aperiodic multilayer broadband polarizer for 13-30 nm wavelength range

M.-Y. Tan, J.-T. Zhu, Z.-S. Wang, K. Le Guen, P. Jonnard, A. Giglia, N. Mahne, S. Nannarone

NIM A654, 588-591 (2011) (http://dx.doi.org/10.1016/j.nima.2011.07.007)


Effective mass of photons in one dimensional photonic crystal

J.-M. André, P. Jonnard

Phys. Scr. 84, 035708 (2011) (http://dx.doi.org/doi:10.1088/0031-8949/84/03/035708)

http://hal.archives-ouvertes.fr/hal-00631235/fr/


DUVEX: an x-ray counting system based on YAG:Ce scintillator

J.-M. André, K. Le Guen, P. Jonnard, Y. Ménesguen

NIM A659, 318-321 (2011) (http://dx.doi.org/10.1016/j.nima.2011.08.010)

http://hal.archives-ouvertes.fr/hal-00637832/fr/


Thermal stability of Mg/Co multilayer with B4C, Mo or Zr diffusion barrier layers

J. T. Zhu, S. K. Zhou, H. Ch. Li, Z. S. Wang, P. Jonnard, K. Le Guen, M.-H. Hu, J.-M. André, H. J. Zhou, T. L. Huo

Opt. Express 19, 21849-21854 (2011) (http://dx.doi.org/10.1364/OE.19.021849)


Contrôle de l’émission spontanée de rayonnement X au moyen d’un cristal photonique mono-dimensionnel

J.-M. André, P. Jonnard

UVX2010, 163-167 (2011) (http://dx.doi.org/10.1051/uvx/2011022)


Some techniques to characterize multilayers and their interfaces

P. Jonnard

Proc. SPIE 7995, 79951T (2011) (http://dx.doi.org/10.1117/12.888172)


Thermal properties, optical and interface characterization of Co/Mg periodic multilayers for the EUV range

M.-H. Hu, K. Le Guen, J.-M. André, P. Jonnard, S. K. Zhou, H. C. Li, J. T. Zhu, Z. S. Wang, N. Mahne, A. Giglia, S. Nannarone

Proc. SPIE 7995, 7995OP (2011) (http://dx.doi.org/10.1117/12.888261)


Introduction of Zr in Mg/Co nanometric periodic multilayers

K. Le Guen, M.-H. Hu, J.-M. André, P. Jonnard, S. K. Zhou, H. C. Li, J. T. Zhu, Z. S. Wang, C. Meny

Proc. SPIE 7995, 799525 (2011) (http://dx.doi.org/10.1117/12.888193)


Optical, chemical, depth and magnetic characterization of Mg/Co-based nanometric periodic multilayers

P. Jonnard, K. Le Guen, M.-H. Hu, J.-M. André, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, N. Mahne, A. Giglia, S. Nannarone, A. Verna, C. Meny, A. Galtayries, M. Walls

Proc. SPIE 8168, 816818 (2011) (http://dx.doi.org/10.1117/12.895316)


DUVEX a versatile EUV-X detector

J.-M. André, K. Le Guen, P. Jonnard, Y. Ménesguen

Proc. SPIE 8167, 816724 (2011) (http://dx.doi.org/10.1117/12.895217)


2010 and before

Electronic structure of Ni-Al interface

Bonnelle, F. Cyrot-Lackmann, P. Jonnard, J. P. Julien, D. Mayou, F. Vergand

Phys. Scr. 38, 100-102 (1988) (http://dx.doi.org/10.1088/0031-8949/38/1/017)


Radiative decay of Al 1s core hole in monocrystalline AlAs

F. Vergand, P. Jonnard, C. Bonnelle

Europhys. Lett. 10, 67-72 (1989) (http://dx.doi.org/10.1209/0295-5075/10/1/012)


Local electronic distribution on Al sites at GaAs/AlAs interface

Jonnard, F. Vergand, C. Bonnelle, C. Deparis, J. Massies

J. Phys. Condensed Matter 3, 3433-3439 (1991) (http://dx.doi.org/10.1088/0953-8984/3/20/005)


Aluminium valence and core excitonic states in GaAs-Ga0.7Al0.3As systems

F. Vergand, P. Jonnard, M. Kefi, C. Bonnelle, C. Deparis, J. Massies

J. Phys. Condensed Matter 5, 1691-1700 (1993) (http://dx.doi.org/10.1088/0953-8984/5/11/009)


Hybridization of Al and O states in a- and g alumina

M. Kefi, P. Jonnard, F. Vergand, C. Bonnelle, E. Gillet

J. Phys. Condensed Matter 5, 8629-8642 (1993) (http://dx.doi.org/10.1088/0953-8984/5/45/016)


Electron energy distributions at AuPd/alumina interfaces

M. Kefi, P. Jonnard, F. Vergand, A. Amamou, C. Bonnelle

J. Phys. D 27, 1952-1958 (1994) (http://dx.doi.org/10.1088/0022-3727/27/9/021)


Instrument for Research on Interfaces and Surfaces (IRIS)

C. Bonnelle, F. Vergand, P. Jonnard, J.-M. André, P. Avila, P. Chargelègue, M.-F. Fontaine, D. Laporte, P. Paquier, A. Ringuenet, B. Rodriguez

Rev. Sci. Instrum. 65, 3466-3471 (1994) (http://dx.doi.org/10.1063/1.1144524)


Correlation between electronic and atomic structures in Ag-Ni multilayers

P. Jonnard, F. Vergand, C. Bonnelle, K. F. Badawi

J. Appl. Phys. 77, 6044-6045 (1995) (http://dx.doi.org/10.1063/1.359191)


 Analyse spatial de la taille d’une source X à l’aide d’un spectromètre à cristal convexe

C. Barré, J.-M. André, P. Jonnard, C. Bonnelle

X-Ray Spectrom. 24, 260-266 (1995) (http://dx.doi.org/10.1002/xrs.1300240510)


Characterization of the polyparaphenylene vinylene-chromium interface by internal reflection infra-red and x-ray emission spectroscopies

T. P. Nguyen, P. Jonnard, F. Vergand, P.-F. Staub, M. Lapkowski, V. H. Tran

Synth. Met. 75, 175-179 (1995) (http://dx.doi.org/10.1016/0379-6779(96)80004-X)


Electron trapping in a-alumina observed by electron induced x-ray emission

P. Jonnard, F. Vergand, M. Kefi, C. Bonnelle

J. Appl. Phys. 79, 2909-2912 (1996) (http://dx.doi.org/10.1063/1.361221)


Study of the interface between polyacrylonitrile thin films and a nickel cathode : Ni 3d states analyzed by EXES

P. Jonnard, F. Vergand, P.-F. Staub, C. Bonnelle, G. Deniau, C. Bureau, G. Lécayon

Surf. Interface Anal. 24, 339-344 (1996)

(http://dx.doi.org/10.1002/(SICI)1096-9918(199605)24:5<339::AID-SIA124>3.0.CO;2-Y)


Temperature-dependent sample holder for x-ray spectrometer

P. Jonnard, P. Chargelègue, C. Hombourger, J. Thirion, F. Vergand

Rev. Sci. Instrum. 67, 2417-2418 (1996) (http://dx.doi.org/10.1063/1.1147011)


Study of the metallized poly(phenylene-vinylene) film interface

T. P. Nguyen, M. Lapkowski, P. Jonnard, F. Vergand, P.-F. Staub, C. Bonnelle, V. H. Tran

AIP Conf. Proc. 354, 327-333 (1996) (http://dx.doi.org/10.1063/1.49487)


X-ray emissions in 3d, 4d and 5d ranges for uranium ions

C. Bonnelle, C. Barré, P. Jonnard, G. Giorgi, F. Vergand

Phys. Rev. A55, 3422-3432 (1997) (http://dx.doi.org/10.1103/PhysRevA.55.3422)


Importance of the mixing of valence states on adhesion at solid-solid interfaces

P. Jonnard, F. Vergand, C. Bonnelle

Int. J. Adh. Adh. 17, 263-267 (1997) (http://dx.doi.org/10.1016/S0143-7496(97)00013-4)


Al 3p valence and excitonic states in GaSb/Al0.3Ga0.7Sb and GaAs/Al0.3Ga0.7As heterostructures as a function of growth process

P. Jonnard, F. Vergand, C. Bonnelle, M. Leroux, J. Massies

Phys. Rev. B55, 15727-15734 (1997) (http://dx.doi.org/10.1103/PhysRevB.55.15727)


Study of the adhesion between a-CH thin films and TA6V substrates by electron-induced x-ray emission spectroscopy (EXES)

P. Jonnard, C. Tixier, J. Desmaison, C. Hombourger, C. Bonnelle

Thin Solid Films 306, 119-129 (1997) (http://dx.doi.org/10.1016/S0040-6090(97)00281-2)


Depth profiles of Al/Mn/Si multilayers

C. Hombourger, P. Jonnard, C. Bonnelle, E. Beauprez, M. Spirckel, B. Feltz, D. Boutard, J.-P. Gallien

Microsc. Microanal. Microstruct. 8, 287-300 (1997) (http://dx.doi.org/10.1051/mmm:1997122)


Physicochemical interaction and atomic structure at Cu-MgO interface

P. Jonnard, C. Hombourger, F. Vergand, C. Bonnelle, A. Renou, A. Assaban, E. Gillet, M. Gillet

Microsc. Microanal. Microstruct. 8, 325-334 (1997) (http://dx.doi.org/10.1051/mmm:1997125)


IntriX: a numerical model for electron probe analysis at high depth resolution. Part II—tests and confrontation with experiments

P.-F. Staub, P. Jonnard, F. Vergand, J. Thirion, C. Bonnelle

X-Ray Spectrom. 27, 58-66 (1998)

(http://dx.doi.org/10.1002/(SICI)1097-4539(199801/02)27:1<58::AID-XRS248>3.0.CO;2-4)


Comparison of Cu-MgO interfaces studied by EXES and XPS

P. Jonnard, C. Hombourger, F. Vergand, C. Bonnelle, B. Ealet, A. Renou, E. Gillet

Surf. Rev. Lett. 5, 369-373 (1998) (http://dx.doi.org/10.1142/S0218625X98000682)


Electron distribution of MgO studied by x-ray emission

P. Jonnard, F. Vergand, C. Bonnelle, E. Orgaz, M. Gupta

Phys. Rev. B57, 12111-12118 (1998) (http://dx.doi.org/10.1103/PhysRevB.57.12111)


Adhesion improvement of Poly(Phenylene-Vinylene) substrates induced by Argon-Oxygen plasma treatment

T. P. Nguyen, A. Lahmar, P. Jonnard

J. Adh. 66, 303-317 (1998) (http://dx.doi.org/10.1080/00218469808009971)


 

Characterization method of the valence states : application to dielectrics and metal-dielectric interfaces

P. Jonnard

J. Phys IV (Fr) 8, Pr9-33-42 (1998) (http://dx.doi.org/10.1051/jp4:1998904)


Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements

C. Hombourger, P. Jonnard, J.-M. André, J.-P. Chauvineau

X-Ray Spectrom. 28, 163-167 (1999)

(http://dx.doi.org/10.1002/(SICI)1097-4539(199905/06)28:3<163::AID-XRS331>3.0.CO;2-Z)


Insulator gap states at the Cu/MgO (001) interface studied by x-ray emission spectroscopy

P. Jonnard, C. Bonnelle

Surf. Sci. 436, L724-L728 (1999) (http://dx.doi.org/10.1016/S0039-6028(99)00703-7)


Investigation of a Mo/SiO2 interface by electron-induced x-ray emission spectroscopy

P. Jonnard, C. Bonnelle, K. Danaie, A. Bosseboeuf, E. Beauprez

Surf. Interface Anal. 29, 255-259 (2000)

(http://dx.doi.org/10.1002/(SICI)1096-9918(200004)29:4<255::AID-SIA736>3.0.CO;2-D)


F and F+ centres in a-Al2O3 by optical and x-ray cathodoluminescence

P. Jonnard, C. Bonnelle, G. Blaise, G. Rémond, C. Rocques-Carmes

J. Appl. Phys. 88, 6413-6417 (2000) (http://dx.doi.org/10.1063/1.1324697)


Effect of argon etching on alumina surfaces and on Pt/alumina interfacesP. Jonnard, P. Kayser

Appl. Surf. Sci. 182, 133-141 (2001) (http://dx.doi.org/10.1016/S0169-4332(01)00470-6)


Experimental and theoretical K x-ray spectra of manganese

P. Jonnard, G. Giorgi, C. Bonnelle

Phys. Rev. A65, 032507 (2002) (6 pages) (http://dx.doi.org/10.1103/PhysRevA.65.032507)


Adhesion properties of aluminium-metallized/ammonia plasma-treated polypropylene. Spectroscopic analysis (XPS, EXES) of the aluminium/polypropylene interface

J. Kurdi, H. Ardelean, P. Marcus, P. Jonnard, F. Arefi-Khonsari

Appl. Surf. Sci. 189, 119-128 (2002) (http://dx.doi.org/10.1016/S0169-4332(02)00017-X)


Study of the NiTi/SiO2 interface : Analysis of the electronic distributions

I. Jarrige, P. Jonnard, N. Frantz-Rodriguez, K. Danaie, A. Bosseboeuf

Surf. Interf. Anal. 34, 694-697 (2002) (http://dx.doi.org/10.1002/sia.1390)


Modulation of x-ray line intensity emitted by a periodic structure under electron excitation

P. Jonnard, J.-M. André, C. Bonnelle, F. Bridou, B. Pardo

Appl. Phys. Lett. 81, 1524-1526 (2002) (http://dx.doi.org/10.1063/1.1502189)

http://hal.archives-ouvertes.fr/hal-00903535


Thickness determination of very thin SiO2 films on Si by electron-induced x-ray emission spectroscopy

C. Hombourger, P. Jonnard, E. O. Filatova, V. Lukyanov

Appl. Phys. Lett. 81, 2740-2742 (2002) (http://dx.doi.org/10.1063/1.1511281)


Emissions X K du manganèse : comparaison entre les spectres du métal et d’une source de 55Fe

C. Bonnelle, P. Jonnard, M.-M. Bé, M.-C. Lépy

Bull. Bureau National de Métrologie 120, 7-16 (2002)

http://hal.archives-ouvertes.fr/hal-01125727


Physico-chemistry and morphology of silicon surface during the first stage of alumina deposition

P. Jonnard, J. Desmaison, H. Hidalgo, F. Rossignol, C. Tixier, P. Tristant

Appl. Surf. Sci. 212-213, 674-678 (2003) (http://dx.doi.org/10.1016/S0169-4332(03)00021-7)


Spectroscopic studies of TM/Si and TM/SiO2 interfaces

I. Jarrige, P. Jonnard, P. Holliger, T. P. Nguyen

Appl. Surf. Sci. 212-213, 689-693 (2003) (http://dx.doi.org/10.1016/S0169-4332(03)00071-0)


Physico-chemical environment of Al impurity atoms in amorphous silica

P. Jonnard, J.-P. Morreeuw, H. Bercegol

Eur. J. Phys. Appl. Phys. 21, 147-149 (2003) (http://dx.doi.org/10.1051/epjap:2002109)

http://hal.archives-ouvertes.fr/hal-01346820


Microstructural and physicochemical study of the buried Fe/AlGaAs (001) interface by transmission electron microscopy and x-ray emission spectroscopy

F. Monteverde, P. Jonnard, S. Harel, A. Michel, J.-P. Eymery

Surf. Interf. Anal. 35, 246-250 (2003) (http://dx.doi.org/10.1002/sia1521)


Bragg amplification of the Si Ka line emitted from a Mo/Si multilayer irradiated by an electron beam

P. Jonnard, J.-M. André, C. Bonnelle, F. Bridou, B. Pardo

AIP Conf. Proc. 652, 99-102 (2003) (http://dx.doi.org/10.1063/1.1536365)


Amplification de Bragg de la raie Si Ka émise par une multicouche Mo/Si irradiée par un faisceau d’électrons : vers un laser X à rétroaction distribuée?

P. Jonnard, J.-M. André, C. Bonnelle, F. Bridou, B. Pardo

J. Phys. IV (Fr) 108, 211-214 (2003) (http://dx.doi.org/10.1051/jp4:20030630)


From diffusion processes to adherence properties in NiTi/Si and NiTi/SiO2 systems

I. Jarrige, P. Holliger, T. P. Nguyen, J. Ip, P. Jonnard

Microelectronic Eng. 70, 251-254 (2003) (http://dx.doi.org/10.1016/S0167-9317(03)00374-5)


Depth profiling of P shallow implants in silicon by Electron-induced X-ray Emission SpectrometryC. Hombourger, P. Jonnard, C. Bonnelle, P.-F. Staub

Eur. Phys. J. Appl. Phys. 24, 115-119 (2003) (http://dx.doi.org/10.1051/epjap:2003078)


Soft x-ray Kossel structures from W/C multilayers under various electron ionization conditions

P. Jonnard, J.-M. André, C. Bonnelle, F. Bridou, B. Pardo

Phys. Rev. A 68, 032505 (2003) (7 pages) (http://dx.doi.org/10.1103/PhysRevA.68.032505)


SOLEX : une source X monochromatique accordable entre 1 et 20 keV pour la métrologie

C. Bonnelle, M.-C. Lépy, J.-M. André, A. Avila, L. Ferreux, P. Jonnard, D. Laporte, J. Plagnard, J.-C. Protas, H. Ringuenet

Bull. Bureau National de Métrologie 122, 11-17 (2003)

http://hal.archives-ouvertes.fr/hal-01179262


Diffusion processes in NiTi/Si, NiTi/SiO2 and NiTi/Si3N4 systems under annealing

I. Jarrige, P. Jonnard, P. Holliger

Thin Solid Films 458, 314-321 (2004) (http://dx.doi.org/10.1016/j.tsf.2003.12.039)


SOLEX : a tunable monochromatic x-ray source in the 1 – 20 keV energy range for metrology

C. Bonnelle, P. Jonnard, J.-M. André, A. Avila, D. Laporte, H. Ringuenet, M.-C. Lépy, J. Plagnard, L. Ferreux, J.-C. Protas

Nucl. Instrum. Meth. Phys. Res. A516, 594-601 (2004)

(http://dx.doi.org/10.1016/j.nima.2003.09.031)       http://hal.archives-ouvertes.fr/hal-01179258


Etude d’un empilement multicouche périodique Mo/Si par spectroscopie d’émission X et par réflectométrie X

P. Jonnard, J.-M. André, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet

J. Phys. IV 118, 231-236 (2004) (http://dx.doi.org/10.1051/jp4:2004118027)


Radiation emitted by an oscillating dipole embedded in a periodic stratified structure: a direct matrix analysis

J.-M. André, P. Jonnard, B. Pardo

Phys. Rev. A 70, 012503 (2004) (6 pages) (http://dx.doi.org/10.1103/PhysRevA.70.012503)


Surface density enhancement of gold in silica film under laser irradiation at 355 nm

P. Jonnard, G. Dufour, J.-L. Rullier, J.-P. Morreeuw, J. T. Donohue

Appl. Phys. Lett. 85, 591-593 (2004) (http://dx.doi.org/10.1063/1.1777391)


Physico-chemical state of the silicon atoms in the HfO2/SiO2/Si system

P. Jonnard, I. Jarrige, O. Renault, J.-F. Damlencourt, F. Martin

Surf. Sci. 572, 396-400 (2004) (http://dx.doi.org/10.1016/j.susc.2004.09.014)


Electronic structure of wurtzite and zinc-blende AlN

P. Jonnard, N. Capron-Joubert, F. Semond, J. Massies, E. Martinez-Guerrero, H. Mariette

Eur. Phys. J. B42, 351-359 (2004) (http://dx.doi.org/10.1140/epjb/e2004-00390-7)

http://hal.ccsd.cnrs.fr/view/ccsd-00000932/fr/          http://arxiv.org/abs/cond-mat/0312245


La/B4C small period multilayer interferential mirrors for the analysis of boron

J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, M.-F. Ravet, F. Delmotte, F. Bridou, E. Filatova

X-Ray Spectrom. 34, 203-206 (2005) (http://dx.doi.org/10.1002/xrs.793)

http://hal.archives-ouvertes.fr/hal-01232846


Control of the reactivity at a metal/silica interface

I. Jarrige, P. Jonnard, I. Vickridge

Appl. Phys. Lett. 86, 204105 (2005) (3 pages) (http://dx.doi.org/10.1063/1.1931821)


 X-ray spectroscopy study of electronic structure of laser-irradiated gold nanoparticles in a silica film

P. Jonnard, H. Bercegol, L. Lamaignère, J.-P. Morreeuw, J.-L. Rullier, E. Cottancin, M. Pellarin

J. Appl. Phys 97, 064306 (2005) (5 pages) (http://dx.doi.org/10.1063/1.1858877)


Satellite lines induced by electrons of near-threshold energy in the x-ray emission band spectra of 3d, 4d, and 5d transition metals

P. Jonnard, I. Jarrige, C. Bonnelle

Phys. Rev. B 71, 155107 (2005) (12 pages) (http://dx.doi.org/10.1103/PhysRevB.71.155107)

http://hal.ccsd.cnrs.fr/ccsd-00002265          http://hal.ccsd.cnrs.fr/ccsd-00002267


Lamellar multilayer amplitude grating as soft-x-ray Bragg monochromator

R. Benbalagh, J.-M. André, R. Barchewitz, P. Jonnard, G. Julié, L. Molard, G. Rolland, C. Rémond, P. Troussel, R. Marmoret, E. O. Filatova

Nucl. Instrum. Meth. Phys. Res. A541, 590-597 (2005)

(http://dx.doi.org/10.1016/j.nima.2004.12.015)


MONOX : a characterization tool for the X-UV range

J.-M. André, A. Avila, R. Barchewitz, R. Benbalagh, R. Delaunay, D. Druart, P. Jonnard, H. Ringuenet

Eur. Phys. J. Appl. Phys. 31, 147-152 (2005) (http://dx.doi.org/10.1051/epjap:2005047)

http://hal.archives-ouvertes.fr/hal-01179271


Physico-chemical and x-ray optical characterizations of a Mo/Si multilayer interferential mirror upon annealing

P. Jonnard, I. Jarrige, R. Benbalagh, H. Maury, J.-M. André, Z. Dankhazi, G. Rolland

Surf. Sci. 589, 164-172 (2005) (http://dx.doi.org/10.1016/j.susc.2005.05.058)


X-ray Raman scattering with Bragg diffraction in a La-based superlattice

J.-M. André, P. Jonnard, C. Bonnelle, E. O. Filatova, C. Michaelsen, J. Wiesmann

Opt. Commun. 255, 267-271 (2005) (http://dx.doi.org/10.1016/j.optcom.2005.06.042)

http://hal.ccsd.cnrs.fr/ccsd-00004911          http://arxiv.org/abs/cond-mat/0505381


Control of the interfacial reactivity in the Ni/Si system

I. Jarrige, R. Delaunay, P. Jonnard

Sol. State Commun. 136, 11-15 (2005) (http://dx.doi.org/10.1016/j.ssc.2005.06.031)


Characterization of a HfO2/SiO2/Si system by x-ray reflection and x-ray emission spectrometries

J.-M. André, E. Filatova, O. Renault, J.-F. Damlencourt, F. Martin, P. Jonnard

Surf. Interf. Anal. 38, 777-780 (2006) (http://dx.doi.org/10.1002/sia.2133)


Analysis of a B4C/Mo/Si multilayer interferential mirror by SIMS : influence of the sputtering ion

H. Maury, P. Holliger, B. Farès, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet, J.-M. André, P. Jonnard

Surf. Interf. Anal. 38, 781-783 (2006) (http://dx.doi.org/10.1002/sia.2154)


Physico-chemical study of the interfaces of Mo/Si multilayer interferential mirrors : correlation with the optical properties

H. Maury, J.-M. André, J. Gautier, F. Bridou, F. Delmotte, M.-F. Ravet, P.Holliger, P. Jonnard

Surf. Interf. Anal. 38, 744-747 (2006) (http://dx.doi.org/10.1002/sia.2248)


X-ray reflection spectroscopy of the HfO2/SiO2/Si system in the region of the O-K absorption edge

E. O. Filatova, P. Jonnard, J.-M. André

Thin Solid Films 500, 219-223 (2006) (http://dx.doi.org/10.1016/j.tsf.2005.11.008)

http://hal.ccsd.cnrs.fr/ccsd-00004944


Non destructive x-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers

H. Maury, P. Jonnard, J.-M. André, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet, A. Jérome, P. Holliger

Thin Solid Films 514, 278-286 (2006) (http://dx.doi.org/10.1016/j.tsf.2006.02.073)


Ultrasoft x-ray reflection and emission spectroscopic analysis of Al2O3/Si structure synthesized by ALD method

E. O. Filatova, E. Yu, Taracheva, A. A. Sokolov, S.V. Bukin, A. S. Shulakov, P. Jonnard, J.-M. André, V. E. Drozd

X-Ray Spectrom. 35, 359-364 (2006) (http://dx.doi.org/10.1002/xrs.919)


Diffusion du rayonnement X monochromatique par une structure multicouche périodique La/B4C au voisinage du seuil La 4d

J.-M. André, P. Jonnard, C. Bonnelle, E. O. Filatova

J. Phys. IV 138, 111–117 (2006) (http://dx.doi.org/10.1051/jp4:2006138014)

http://hal.archives-ouvertes.fr/hal-01233235


Multilayer interfacial mirrors as components for soft-x-ray WDS monochromators and tunable radiation sources

J.-M. André, P. Jonnard, R. Benbalagh

X-Ray Spectrom. 36, 62-65 (2007) (http://dx.doi.org/10.1002/xrs.933)


Quantitative TEM characterizations of La/B4C and Mo/B4C ultrathin multilayer gratings by the geometric phase method

M. Häussler, E. Spiecker, W. Jäger, M. Störmer, R. Bormann, C. Michaelsen, J. Wiesmann, G. Zwicker, R. Benbalagh, J.-M. André, P. Jonnard

Microelectronic Eng. 84, 454-459 (2007) (http://dx.doi.org/10.1016/j.mee.2006.10.060)


Wavelength dispersive spectroscopy analysis at high spectral resolution : application to the study of Mo/Si multilayers

P. Jonnard, H. Maury, J.-M. André

X-Ray Spectrom. 36, 72-75 (2007) (http://dx.doi.org/10.1002/xrs.940)


Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive x-ray techniques

H. Maury, P. Jonnard, J.-M. André, J. Gautier, F. Bridou, F. Delmotte, M.-F. Ravet

Surf. Sci. 601, 2315-2322 (2007) (http://dx.doi.org/10.1016/j.susc.2007.03.044)


X-ray interface analysis of aperiodic Mo/Si multilayers

K. Le Guen, H. Maury, J.-M. André, H. Wang, J. Zhu, Z. Wang, P. Jonnard

Appl. Surf. Sci. 253, 8443-8446 (2007) (http://dx.doi.org/10.1016/j.apsusc.2007.04.033)


X-ray scattering from etched and coated multilayer gratings

M. Störmer, J.-M. André, C. Michaelsen, R. Benbalagh, P. Jonnard

J. Phys. D40, 4253-4258 (2007) (http://dx.doi.org/10.1088/0022-3727/40/14/022)


X-ray spectroscopic application of Cr/Sc periodic multilayers

K. Le Guen, H. Maury, J.-M. André, P. Jonnard, A. Hardouin, F. Delmotte, M.-F. Ravet

Appl. Phys. Lett. 91, 234104 (2007) (http://dx.doi.org/10.1063/1.2821379)

http://hal.archives-ouvertes.fr/hal-00575878/


Interdiffusion effects in as-deposited Al/Ni polycrystalline multilayers

M. Salou, S. Rioual, J. Ben Youssef, D. Dekadjevi, S. Pogossian, P. Jonnard, K. Le Guen, G. Gamblin, B. Lépine, B. Rouvellou

Surf. Interf. Anal. 40, 1318-1321 (2008) (http://dx.doi.org/10.1002/sia.2896)


Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers

H. Maury, P. Jonnard, K. Le Guen, J.-M. André, Z. Wang, J. Zhu, J. Dong, Z. Zhang, F. Bridou, F. Delmotte, C. Hecquet, N. Mahne, A. Giglia, S. Nannarone

Eur. Phys. J. B64, 193-199 (2008) (http://dx.doi.org/10.1140/epjb/e2008-00290-x)

http://hal.archives-ouvertes.fr/hal-00256010/fr/


Electronic structure of Ni and Mo silicides investigated by x-ray emission spectroscopy and density functional theory

I. Jarrige, N. Capron, P. Jonnard

Phys. Rev. B79, 035117 (2009) (http://dx.doi.org/10.1103/PhysRevB.79.035117)

http://hal.archives-ouvertes.fr/hal-00844567


Characterization of Al and Mg alloys from their emission band

P. Jonnard, K. Le Guen, R. Gauvin, J.-F. Le Berre

Microscopy & Microanalysis 15, 36-45 (2009) (http://dx.doi.org/10.1017/S1431927609090060)

http://hal.archives-ouvertes.fr/hal-00844561                       https://arxiv.org/abs/1307.3959


Spectroscopic study of interfaces in Al/Ni periodic multilayers

K. Le Guen, G. Gamblin, J.-M. André, P. Jonnard, M. Salou, J. Ben Youssef, S. Rioual, B. Rouvellou

Eur. Phys. J. Appl. Phys. 45, 20502 (2009) (4 pages) (http://dx.doi.org/10.1051/epjap:2008189)

http://hal.archives-ouvertes.fr/hal-00844545                       https://arxiv.org/abs/1307.3958


High-resolution x-ray analysis with multilayer gratings

P. Jonnard, K. Le Guen, J.-M. André

X-Ray Spectrom. 38, 117-120 (2009) (http://dx.doi.org/10.1002/xrs.1128)

http://hal.archives-ouvertes.fr/hal-00808363                       https://arxiv.org/abs/1304.1777


Analysis of Mo/Si multilayers: influence of the Mo thickness

H. Maury, J.-M. André, K. Le Guen, N. Mahne, A. Giglia, S. Nannarone, F. Bridou, F. Delmotte, P. Jonnard

Surf. Sci. 603, 407-411 (2009) (http://dx.doi.org/10.1016/j.susc.2008.12.002)

http://hal.archives-ouvertes.fr/hal-00761558                       https://arxiv.org/abs/1212.1258


Stokes reciprocity equations and density of modes for absorbing stratified media

J.-M. André, P. Jonnard

J. Mod. Opt. 56, 1562-1571 (2009) (http://dx.doi.org/10.1080/09500340903184337

J. Mod. Opt. 56, 2384-2386 (2009) (http://dx.doi.org/10.1080/09500340903470074)


X-ray spontaneous emission control by 1-dimensional photonic bandgap structure

J.-M. André, P. Jonnard

Eur. Phys. J. D57, 411-418 (2010) (http://dx.doi.org/10.1140/epjd/e2010-00050-7)

http://hal.archives-ouvertes.fr/hal-00596495/fr/


Interfacial properties and characterization of Sc/Si multilayers

T. N. Shendruk, A. Moeves, E. Z. Kurmaev, P. Ochin, H. Maury, J.-M. André, K. Le Guen, P. Jonnard

Thin Solid Films 518, 3808-3812 (2010) (http://dx.doi.org/10.1016/j.tsf.2010.01.036)


Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach

A. Galtayries, M.-H. Hu, K. Le Guen, J.-M. André, P. Jonnard, E. Meltchakov, C. Hecquet, F. Delmotte

Surf. Interf. Anal. 42, 653-657 (2010) (http://dx.doi.org/10.1002/sia.3393)


Development and interfacial characterization of Co/Mg periodic multilayers in the EUV range

K. Le Guen, M.-H. Hu, J.-M. André, P. Jonnard, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, C. Meny

J. Phys. Chem. C114, 6484-6490 (2010) (http://dx.doi.org/10.1021/jp911119z)

http://hal.archives-ouvertes.fr/hal-00661047


Effect of B4C diffusion barriers on the thermal stability of Sc/Si periodic multilayers

P. Jonnard, H. Maury, K. Le Guen, J.-M. André, N. Mahne, S. Nannarone, F. Bridou

Surf. Sci. 604, 1015-1021 (2010) (http://dx.doi.org/10.1016/j.susc.2010.03.012)

http://hal.archives-ouvertes.fr/hal-00661057


Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength

J. Zhu, S. Zhou, H. Li, Q. Huang, Z. Wang, K. Le Guen, M.-H. Hu, J.-M. André, P. Jonnard

Appl. Opt. 49, 3922-3925 (2010) (http://dx.doi.org/10.1364/AO.49.003922)


Surface dynamic at the early stage of Al2O3 films growth on rough substrates

E. O. Filatova, L. Peverini, E. Ziegler, I. V. Kozhevnikov, P. Jonnard, J.-M. André

J. Phys. Cond. Mat. 22, 345003 (2010) (8 pages) (http://dx.doi.org/10.1088/0953-8984/22/34/345003)


Dynamic of charge trapping in electron-irradiated alumina

C. Bonnelle, P. Jonnard

Phys. Rev. B82, 075132 (2010) (8 pages) (http://dx.doi.org/10.1103/PhysRevB.82.075132)

http://hal.archives-ouvertes.fr/hal-00596486/fr/


On the Kramers-Kronig transform with logarithmic kernel for the reflection phase in the Drude model

J.-M. André, K. Le Guen, P. Jonnard, N. Mahne, A. Giglia, S. Nannarone

J. Mod. Opt. 57, 1504 (2010) (http://dx.doi.org/10.1080/09500340.2010.506015)

http://hal.archives-ouvertes.fr/hal-00643271/fr/        http://arxiv.org/abs/1111.5139


Structural properties of Al/Mo/SiC multilayers with high reflectivity for extreme ultraviolet light

M.-H. Hu, K. Le Guen, J.-M. André, P. Jonnard, E. Meltchakov, F. Delmotte, A. Galtayries

Optics Express 18, 20019-20028 (2010) (http://dx.doi.org/10.1364/OE.18.020019)

http://hal-iogs.archives-ouvertes.fr/hal-00557554