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philippe.jonnard@sorbonne-universite.fr
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2024
See the main page of the team
2023
Division Groupement National de Microscopie Électronique à Balayage et microAnalyses (GN-MEBA)
F. Brisset, F. Robaut, G. Wille, P. Jonnard, J. Ruste, D. Boivin, G. Slodzian, D. Blavette, E. Cadel
Les 150 ans de la Société Française de Physique - Panorama historique et scientifique, EDP Sciences, 2023
ISBN : 978-2-7598-3075-6
Calculation of emission spectra of lithium compounds
K. Hassebi, K. Le Guen, N. Rividi, A. Verlaguet, P. Jonnard
X-Ray Spectrom. 52, 330-336 (2023) (http://doi.org/10.1002/xrs.3329)
https://hal.science/hal-04243782v1
Combined x-ray reflectivity and grazing incidence x-ray fluorescence study of Ta/Cr/Pt thin film stacks
P. Jonnard, K. Le Guen, R. Delaunay, Y. Ménesguen, M.-C. Lépy, E. Briand, D. Schmaus, I Vickridge
X-Ray Spectrom. 52, 437-446 (2023) (https://doi.org/10.1002/xrs.3382)
https://hal.science/hal-04244005
2022
Electron probe microanalysis of light elements - Improvements in the measurement and signal extraction methods
P. Schweizer, E. Brackx, P. Jonnard
X-ray Spectrom. 51, 403-412 (2022) (http://doi.org/10.1002/xrs.3290)
https://hal-cea.archives-ouvertes.fr/cea-03669863
Study of interface reaction in B4C/Cr mirror like sample: A study using soft x-ray reflectivity technique
M.H. Modi, S. Gupta, P.K. Yadav, R.K. Gupta, A. Bose, C. Mukherjee, P. Jonnard, M. Idir
J. Sync. Rad. 29, 978-984 (2022) (https://doi.org/10.1107/S1600577522004738)
https://hal.archives-ouvertes.fr/hal-03722588v1
Composition and optical properties of chromium oxynitride films
J. Wang, H. Qian, Y.-Y. Yuan, Y.-C. Tu, C. Yan, R. Lan, P. Jonnard
Surf. Interf. Anal. 54, 1142-1150 (2022) (https://doi.org/10.1002/sia.7138)
https://hal.archives-ouvertes.fr/hal-03798629
Interface analysis of Mg/Sc and Sc/Mg bilayer using x-ray reflectivity
H. Verma, K. Le Guen, M.H. Modi, S. Gupta, R. Dhawan, P. Jonnard
Thin Solid Films 763, 139595 (2022) (https://doi.org/10.1016/j.tsf.2022.139595)
https://hal.archives-ouvertes.fr/hal-03890526
2021
A simple approach for thickness measurements using electron probe microanalysis
M. Essani, V. Krawiec, E. Brackx, E. Excoffier, P. Jonnard
Microscopy & Microanalysis 27, 337-343 (2021) (https://doi.org/10.1017/S1431927621000088)
https://hal.archives-ouvertes.fr/hal-03213374
Maxwell-Bloch modeling of an x-ray pulse amplification in a 1D photonic crystal
O. Peyrusse, P. Jonnard, J.-M. André
Phys. Rev. A103, 043508 (2021) (10 pages) (https://doi.org/10.1103/PhysRevA.103.043508)
https://hal.archives-ouvertes.fr/hal-03224248v1 http://arxiv.org/abs/2012.01069
Periodic multilayer for x-ray spectroscopy in the Li K range
V. Polkonikov, N. Chkhalo, R. Pleshkov, A. Giglia, N. Rividi, E. Brackx, K. Le Guen, I. Ismail, P. Jonnard
Appl. Sci. 11, 6385 (2021) (7 pages) (https://doi.org/10.3390/app11146385)
https://hal.archives-ouvertes.fr/hal-03284367
Study of buried interfaces in Fe/Si Multilayer by hard X-ray emission spectroscopy
H. Verma, K. Le Guen, R. Delaunay, I. Ismail, V. Ilakovac, J.-P. Rueff, Y.-L. Zheng, P. Jonnard
Surf. Interface Anal. 53, 1043-1047 (2021) (http://doi.org/10.1002/sia.7005)
https://hal.sorbonne-universite.fr/hal-03428877
2020
X-ray emission from layered media irradiated by an x-ray free-electron laser
O. Peyrusse, P. Jonnard, K. Le Guen, J.-M. André
Phys. Rev. A101, 013818 (2020) (10 pages) (https://doi.org/10.1103/PhysRevA.101.013818)
https://hal.archives-ouvertes.fr/hal-02458070
New insights into the structure and degradation of alizarin lake pigments: non-stoichiometric and surface study
G.-Z. Zhuang, S. Pedetti, J. Bourlier, P. Jonnard, C. Méthivier, P. Walter, C.-M. Pradier, M. Jaber
J. Phys. Chem. C124, 12370–12380 (2020) (https://doi.org/10.1021/acs.jpcc.0c00746)
https://hal.archives-ouvertes.fr/hal-02887434
Characterization of the chemical composition of uranium microparticles with irregular shapes using standardless electron probe microanalysis and micro-Raman spectrometry
M. Essani, E. Brackx, F. Pointurier, F. Berthy, E. Excoffier, P. Jonnard
Anal. Chem. 92, 8435-8443 (2020) (https://doi.org/10.1021/acs.analchem.0c01124)
https://hal.archives-ouvertes.fr/hal-03039927
Interdiffusion behaviors observation in TiN/ZrOxNy bilayer by XAS and ToF-SIMS
Y.-Y. Yuan, P. Jonnard, K. Le Guen, B.-Y. Zhang, A. Galtayries, A. Giglia, Y.-C. Tu, C. Yan, R. Lan, R. Liu
Appl. Surf. Sci. 528, 146968 (2020) (8 pages) (https://doi.org/10.1016/j.apsusc.2020.146968)
https://hal.archives-ouvertes.fr/hal-02882706
Laboratory grazing-incidence X-ray fluorescence spectroscopy as an analytical tool for the investigation of sub-nanometer CrSc multilayer water window optics
V. Szwedowski-Rammert, P. Hönicke, M.-Y. Wu, U. Waldschläger, A Gross, J. Baumann, G. Götzke, F. Delmotte, E. Meltchakov, B. Kanngießer, P. Jonnard, I. Mantouvalou
Spectrochim. Acta B174, 105995 (2020) (6 pages) (https://doi.org/10.1016/j.sab.2020.105995)
https://hal.archives-ouvertes.fr/hal-02982883 https://arxiv.org/abs/2006.12198
Improving the soft X-ray reflectivity of Cr/Ti multilayers by co-deposition of B4C
J.-T. Zhu, J.-Y. Zhang, H.-C. Li, Y.-C. Tu, J.-W. Chen, H.-C. Wang, S. S. Dhesi, M.-Q. Cui, J. Zhu, P. Jonnard
J. Sync. Rad. 27, 1614-1617 (2020) (https://doi.org/10.1107/S1600577520011741)
https://hal.archives-ouvertes.fr/hal-02995210
Smoothing effect of Si-layers in Be/Al multi-layer mirrors for the 17 to 31-nm spectral range (Сглаживающий эффект Si-слоев в многослойных зеркалах Be/Al для спектрального диапазона 17-31 nm)
R. S. Pleshkov, S. Y. Zuev, V. N. Polkonikov, N. N. Salashchenko, M. V.Svechnikov, N. I. Chkalo, P. Jonnard
Tech. Phys. 65,1786–1791(2020) (https://doi.org/10.1134/S1063784220110201)
J. Tech. Phys. 90, 1870-1875 (2020) (http://dx.doi.org/10.21883/JTF.2020.11.49977.135-20)
https://hal.archives-ouvertes.fr/hal-03039857 https://hal.archives-ouvertes.fr/hal-02925870v1
2019
Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer
M.-Y. Wu, K. Le Guen, J.-M. André, P. Jonnard, I. Vickridge, D. Schmaus, E. Briand, P. Walter, Q.-S. Huang, Z.-S. Wang
NIM B450, 252-256 (2019) (https://doi.org/10.1016/j.nimb.2018.08.008)
https://hal.archives-ouvertes.fr/hal-02162011v1
Kossel effect in periodic multilayers
K. Le Guen, J.-M. André, M.Y. Wu, V. Ilakovac, F. Delmotte, S. de Rossi, F. Bridou, E. Meltchakov, A. Giglia, S. Nannarone, Z.-S. Wang, Q.-S. Huang, Z. Zhang, J.-T. Zhu, Y.-C. Tu, Y.-Y. Yuan, I. Vickridge, D. Schmaus, E. Briand, S. Steydli, P. Walter, P. Jonnard
J. Nanosci. Nanotechnol. 19, 593-601 (2019) (https://dx.doi.org/10.1166/jnn.2019.16472)
https://hal.archives-ouvertes.fr/hal-01909419
Impact of KF-post deposition treatment on Cu(In,Ga)Se2 surface and Cu(In,Ga)Se2/CdS interface sulfurization
S. Harel, P. Jonnard, T. Lepetit, L. Arzel, N. Barreau
Appl. Surf. Sci. 473, 1062-1065 (2019) (https://doi.org/10.1016/j.apsusc.2018.12.062)
https://hal.archives-ouvertes.fr/hal-01990439
Kossel interferences of proton-induced X-ray emission lines to study thin film waveguides
J.-P. Zhang, C. Pendenque, K. Le Guen, R. Delaunay, I. Vickridge, D. Schmaus, Q.-G. Fu, P. Jonnard
NIM B452, 12-20 (2019) (https://doi.org/10.1016/j.nimb.2019.05.053)
https://hal.archives-ouvertes.fr/hal-02142094
Structure and optical properties of CrOxNy films with composition modulation
Y.-Y. Yuan, B.-Y. Zhang, J. Sun, P. Jonnard, K. Le Guen, Y.-C. Tu, C. Yan, R. Lan
Surface Engineering (2019), sous presse (https://doi.org/10.1080/02670844.2019.1656356)
Characterization of Mg/Sc multilayers with and without Co barriers layers for x-ray spectroscopy in the water window range
P. Jonnard, M.-Y. Wu, K. Le Guen, A. Giglia, K. Koshmak, Q.-S. Huang, Z. Zhang, Z.-S. Wang, I. Estève, N. Menguy, B. Doisneau
J. Appl. Phys. 126. 195301 (2019) (https://doi.org/10.1063/1.5128867)
https://hal.archives-ouvertes.fr/hal-02375696v1
2018
Evolution of interfacial structure of Co-based periodic multilayers upon annealing
Y.-Y. Yuan, K. Le Guen, C. Mény, C. Ulhaq-Bouillet, J.-T. Zhu, Z.-S. Wang, P. Jonnard
Surf. Coat. Technol. 352, 508-512 (2018) (https://doi.org/10.1016/j.surfcoat.2018.08.054)
https://hal.sorbonne-universite.fr/hal-01876410
Characterization of Pd/Y multilayers with B4C barrier layers using GIXR and x-ray standing wave enhanced HAXPES
M.-Y. Wu, Q.-S. Huang, K. Le Guen, V. Ilakovac, B.-X. Li, Z.-S. Wang, A. Giglia, J.-P. Rueff, P. Jonnard
J. Sync. Rad. 25, 1417-1424 (2018) (https://doi.org/10.1107/S1600577518009402)
https://hal.sorbonne-universite.fr/hal-01876424 https://arxiv.org/abs/1809.10986
Depth analysis of Al/ZrC interfaces using SIMS and x-ray reflectivity techniques
M.H. Modi, M. Sinha, A. Bose, A. Singh, P. Jonnard
Surf. Interf. Anal. 50, 1239-1242 (2018) (http://dx.doi.org/10.1002/sia.6443)
https://hal.archives-ouvertes.fr/hal-01919286
Study of the Au-Cr bilayer system using x-ray reflectivity, GDOES and ToF-SIMS
P. Jonnard, M. H. Modi, K. Le Guen, N. Aneshwari, M. Sinha, M. Idir, P. Chapon, A. Galtayries
Surf. Interf. Anal. 50, 1213-1217 (2018) (http://dx.doi.org/10.1002/sia.6445)
https://hal.archives-ouvertes.fr/hal-01919823
Soft x-ray characterization of ion beam sputtered magnesium oxide (MgO) thin film
M. Sinha, M. Gupta, M.H. Modi, P. Jonnard
Surf. Interf. Anal. 50, 1145-1148 (2018) (http://dx.doi.org/10.1002/sia.6446)
Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer
P. Jonnard, M.-Y. Wu, J.-M. André, K. Le Guen, Z.-S. Wang, Q.-S. Huang, I. Vickridge, D. Schmaus, E. Briand, S. Steydli, P. Walter
Rev. Sci. Instrum. 89, 096109 (2018) (https://doi.org/10.1063/1.5040980)
https://hal.archives-ouvertes.fr/hal-01882729v1 https://arxiv.org/abs/1809.10989
2017
X-ray absorption spectroscopy study of buried Co layers in the Co/Mo2C multilayer mirrorsY.-Y. Yuan, K. Le Guen, Y.-C. Tu, J.-T. Zhu, Z.-S. Wang, W.-B. Li, M.-W. Wen, C. Meny, H.-S. Yu, Y.-X. Huang, X.-J. Wei, P. JonnardSurf. Interf. Anal. 49, 205-209 (2017) (http://dx.doi.org/10.1002/sia.6116)http://hal.archives-ouvertes.fr/hal-01480541
Ultra-short and ultra-intense x-ray free-electron laser single pulse in one-dimensional photonic crystalsJ.-M. André, P. JonnardJ. Sync. Rad. 24, 376-385 (2017) (https://doi.org/10.1107/S1600577517000820)http://hal.upmc.fr/hal-01474782v1
Investigation of ZrC/Al interfaces in a Al/ZrC/Al/W waveguide-like structure by soft x-ray reflectivity techniqueA. Singh, M. H. Modi, P. Jonnard, K. Le Guen and J.-M. André.J. Elec. Spectrosc. Rel. Phenom. 220, 6-8 (2017) (https://doi.org/10.1016/j.elspec.2017.03.002)
Nitridated Pd/B4C multilayer mirrors for soft X-ray region: internal structure and aging effectsY.-W. Wang, Q.-S. Huang, Q. Yi, I. V. Kozhevnikov, R.-Z. Qi, M.-W. Wen, P. Jonnard, J.-S. Zhang, A. Giglia, Z. Zhang, Z.-S. WangOpt. Exp. 25, 7749-7760 (2017) (https://doi.org/10.1364/OE.25.007749)
Design, development and applications of etched multilayers for soft x-ray spectroscopyK. Le Guen, R. Benbalagh, J.-M. André, J.-R. Coudevylle, P. JonnardEur. Phys. J. Appl. Phys. 78, 20702 (2017) (https://doi.org/10.1051/epjap/2017160287)https://hal.archives-ouvertes.fr/hal-01527456v1
EUV stimulated emission from MgO pumped by FEL pulsesP. Jonnard, J.-M. André, K. Le Guen, M.-Y. Wu, E. Principi, A. Simoncig, A. Gessini, R. Mincigrucci, C. Masciovecchio, O. PeyrusseStruc. Dyn. 4, 054306 (2017) (http://dx.doi.org/10.1063/1.4993293)https://hal.archives-ouvertes.fr/hal-01664322v1Featured by the editor
Thermal and temporal stability of V/Sc multilayer mirror for the soft X-ray water window regionQ. Yi, Q.-S. Huang, J.-S. Zhang, X.-M. Wang, R.-Z. Qi, Z. Zhang, T.-P. Peng, P. Jonnard, A. Giglia, Z.-S. WangVacuum 146, 187-193 (2017) (https://doi.org/10.1016/j.vacuum.2017.09.030)
Modeling of the interaction of an XFEL with large finite samplesO. Peyrusse, J.-M. André, P. Jonnard, J. GaudinPhys. Rev. E96, 043205 (2017) (https://doi.org/10.1103/PhysRevE.96.043205)https://hal.archives-ouvertes.fr/hal-01344717
High reflectance nanoscale V/Sc multilayer for soft x-ray water window regionQ.-S. Huang, Q. Yi, Z.-D. Cao, R.-Z. Qi, R. Loch, P. Jonnard, M.-Y. Wu, A. Giglia, W.-B. Li, E. Louis, F. Bijkerk, Z. Zhang, Z.-S. WangSci. Rep. 7, 12929 (2017) (https://doi.org/10.1038/s41598-017-13222-5)
Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave enhanced x-ray fluorescenceM.-Y. Wu, C. Burcklen, J.-M. André, K. Le Guen, A. Giglia, K. Koshmak, S. Nannarone, F. Bridou, E. Meltchakov, S. de Rossi, F. Delmotte, P. JonnardOpt. Eng. 56, 117101 (2017) (http://dx.doi.org/10.1117/1.OE.56.11.117101)https://hal.archives-ouvertes.fr/hal-01630278
2016
Time-dependent Bragg diffraction by multilayer gratings
J.-M. André, P. Jonnard
J. Opt. 18, 015603 (2016) (http://dx.doi.org/10.1088/2040-8978/18/1/015603)
http://hal.archives-ouvertes.fr/hal-01233488 https://arxiv.org/abs/1511.08094
High reflectance Cr/V multilayer with B4C barrier layer for water window wavelength region
Q.-S. Huang, J.-N. Fei, Y. Liu, P. Li, M.-W. Wen, P. Jonnard, A. Giglia, Z. Zhang, K. Wang, Z.-S. Wang
Opt. Lett. 41, 701-704 (2016) (http://dx.doi.org/10.1364/OL.41.000701)
Kossel interferences of proton-induced x-ray emission lines in periodic multilayers
M.-Y. Wu, K. Le Guen, J.-M. André, V. Ilakovac, I. Vickridge, D. Schmaus, C. Burcklen, F. Bridou, E. Meltchakov, S. de Rossi, F. Delmotte, P. Jonnard
Nucl. Instrum. Meth. Phys. Res. B386, 39-43 (2016) (http://dx.doi.org/10.1016/j.nimb.2016.09.014)
http://hal.archives-ouvertes.fr/hal-01374375 https://arxiv.org/abs/1612.02140
Cr/Sc multilayer radiator for parametric EUV radiation in “water-window” spectral range
S. R. Uglov, V. V. Kaplin, A. S. Kubankin, J.-M. André, K. Le Guen, P. Jonnard, S. de Rossi, E. Meltchakov, F Delmotte
J. Phys. Conf. Ser. 732, 012017 (2016) (http://dx.doi.org/10.1088/1742-6596/732/1/012017)
2015
Inter-laboratory comparison of a WDS-EDS analysis of a metallic glass
P. Jonnard, F. Brisset, F. Robaut, G. Wille, J. Ruste
X-Ray Spectrom. 44, 24-29 (2015) (http://dx.doi.org/10.1002/xrs.2573)
http://hal.archives-ouvertes.fr/hal-01188759 https://arxiv.org/abs/1509.00261
Interface observation of heat-treated Co/Mo2C multilayer
Y.-Y. Yuan, K. Le Guen, J.-M. André, C. Mény, C. Ulhaq, A. Galtayries, J.-T. Zhu, Z.-S. Wang, P. Jonnard
Appl. Surf. Sci. 331, 8-16 (2015) (http://dx.doi.org/10.1016/j.apsusc.2014.12.055)
http://hal.archivesouvertes.fr/hal-01110582 http://arxiv.org/abs/1501.07360
Time-dependent Bragg diffraction and short-pulse reflection by one-dimensional photonic crystals
J.-M. André, P. Jonnard
J. Opt. 17, 085609 (2015) (http://dx.doi.org/10.1088/2040-8978/17/8/085609)
http://hal.archives-ouvertes.fr/hal-01114371 https://arxiv.org/abs/1509.00263
Kossel diffraction and photonic modes in one-dimensional photonic crystal
J.-M. André, P. Jonnard, K. Le Guen, F. Bridou
Phys. Scr. 90, 085503 (2015) (http://dx.doi.org/10.1088/0031-8949/90/8/085503)
http://hal.archives-ouvertes.fr/hal-01188789 https://arxiv.org/abs/1509.00281
X-ray fluorescence induced by standing waves in the grazing incidence and grazing exit modes: study of the Mg-Co-Zr system
Y.-C. Tu, Y.-Y. Yuan, K. Le Guen, J.-M. André, J.-T. Zhu, Z.-S. Wang, F. Bridou, A. Giglia, P. Jonnard
J. Sync. Rad. 22, 1419-1425 (2015) (http://dx.doi.org/10.1107/S1600577515016239)
http://hal.archives-ouvertes.fr/hal-01224951 https://arxiv.org/abs/1511.01739
Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors
D.-C. Xu, Q.-S. Huang, Y.-W. Wang, P. Li, M.-W. Wen, P. Jonnard, A. Giglia, I. V. Kozhevnikov, Z. Zhang, Z.-S. Wang
Opt. Exp. 23, 33018-33026 (2015) (http://dx.doi.org/10.1364/OE.23.033018)
2014
X-ray quasi-lamellar etched multilayers: analysis by coupled-mode theory
J.-M. André, K. Le Guen, P. Jonnard
X-Ray Spectrom. 43, 122-125 (2014) (http://dx.doi.org/10.1002/xrs.2526)
http://hal.archives-ouvertes.fr/hal-00945900
Co/Mo2C multilayer as x-ray mirror: optical and thermal performances
Y.-Y. Yuan, K. Le Guen, J.-M. André, Z.-S. Wang, H.-C. Li, J.-T. Zhu, C. Mény, A. Giglia, S. Nannarone P. Jonnard
Phys. Stat. Sol. B251, 803-808 (2014) (http://10.1002/pssb.201350082)
http://hal.archives-ouvertes.fr/hal-01253622
Structural changes induced by thermal annealing in Cr/C multilayers
Y.-C. Tu, J.-T. Zhu, H.-C. Li, P. Jonnard, K. Le Guen, H. Chen, Z.-S. Wang
Appl. Surf. Sci. 313, 341-345 (2014) (http://dx.doi.org/10.1016/j.apsusc.2014.05.212)
Feasibility considerations of a soft-x-ray distributed feedback laser pumped by an X-FEL
J.-M. André, K. Le Guen, P. Jonnard
Laser Phys. 24, 085001 (2014) (http://dx.doi.org/10.1088/1054-660X/24/8/085001)
http://hal.archives-ouvertes.fr/hal-01011251 http://arxiv.org/abs/1406.6001
Spontaneous x-ray fluorescence from a superlattice under Kossel diffraction conditions
P. Jonnard, Y.-Y. Yuan, K. Le Guen, J.-M. André, J.-T. Zhu, Z.-S. Wang, F. Bridou
J. Phys. B47, 165601 (2014) (http://dx.doi.org/10.1088/0953-4075/47/16/165601)
http://hal.archives-ouvertes.fr/hal-01058829
Optical and structural characterization of the Co/Mo2C/Y system
Y.-Y. Yuan, K. Le Guen, J.-M. André, Z.-S. Wang, J.-T. Zhu, C. Mény, P. Jonnard
Appl. Surf. Sci. 315, 499-505 (2014) (http://dx.doi.org/10.1016/j.apsusc.2014.03.176)
http://hal.archives-ouvertes.fr/hal-01065948
Thermal stability of Co/C multilayers
J.-T. Zhu, Y.-C. Tu, Y.-Y. Yuan, Z.-X. Feng, Y.-Z. Zhang, P. Jonnard, C. Mény, K. Le Guen, J.-M. André, Z.-S. Wang
Mat. Res. Exp. 1, 046503 (2014) (http://dx.doi.org/10.1088/2053-1591/1/4/046503)
http://hal.archives-ouvertes.fr/hal-01238002
2013
Characterization of multilayers and their interlayers: application to Co-based systems
P. Jonnard, Z.-S. Wang, J.-T. Zhu, C. Mény, J.-M. André, M.-H. Hu, K. Le Guen
Chin. Opt. Lett. 11(S1), S10601 (2013) (http://dx.doi.org/10.3788/COL201311.S10601)
http://hal.archivesouvertes.fr/hal-01100238
Zr/Mg multilayer mirror for extreme ultraviolet application and its thermal stability
H.-C. Li, J.-T. Zhu, S.-K. Zhou, Z.-S. Wang, H. Chen, P. Jonnard, K. Le Guen, J.-M. André
Appl. Phys. Lett. 102, 111103 (2013) (http://dx.doi.org/10.1063/1.4794399)
Oscillating dipole model for the x-ray standing wave enhanced fluorescence in periodic multilayers
J.-M. André, K. Le Guen, P. Jonnard
Spectrochimica Acta B85, 55-61 (2013) (http://dx.doi.org/10.1016/j.sab.2013.03.012)
http://hal.archives-ouvertes.fr/hal-00832205 https://arxiv.org/abs/1306.2431
The transition from amorphous to crystalline in Al/Zr multilayers
Q. Zhong, Z. Zhang, S. Ma, R. Qi, J. Li, Z.-S. Wang, K. Le Guen, J.-M. André, P. Jonnard
J. Appl. Phys. 113, 133508 (2013) (http://dx.doi.org/10.1063/1.4799013)
http://hal.archives-ouvertes.fr/hal-00757458 https://arxiv.org/abs/1211.6301
Thermally-induced structural modification in the Al/Zr multilayers
Q. Zhong, S. Ma, Z. Zhang, R. Qi, J. Li, Z.-S. Wang, K. Le Guen, J.-M. André, P. Jonnard
Appl. Surf. Sci. 279, 334-342 (2013) (http://dx.doi.org/10.1016/j.apsusc.2013.04.094)
http://hal.archives-ouvertes.fr/hal-00744814 https://arxiv.org/abs/1210.6442
Enhancement of the reflectivity of Al(1%wtSi)/Zr multilayers by a novel structure
Q. Zhong, Z. Zhang, R.-Z. Qi, J. Li, Z.-S. Wang, K. Le Guen, J.-M. André, P. Jonnard
Opt. Express 21, 14399-14408 (2013) (http://dx.doi.org/10.1364/OE.21.014399)
http://hal.archives-ouvertes.fr/hal-00767508
Optical performance, structure and thermal stability of Al(1wt.-%Si)/Zr and Al(pure)/Zr multilayers designed for the 17–19 nm range
Q. Zhong, W.-B. Li, Z. Zhang, J.-T. Zhu, Q.-S. Huang, H.-C. Li, Z.-S. Wang, P. Jonnard, K. Le Guen, Y.-Y. Yuan, J.-M. André, H.-J. Zhou, T.-L. Huo
Chin. Opt. Lett. 11(S1), S10603 (2013) (http://dx.doi.org/10.3788/COL201311.S10603)
http://hal.archivesouvertes.fr/hal-01100238
Photonic bandgaps of periodic multilayers with diffuse interfaces
J.-M. André, P. Jonnard
JOSA B30, 2296-2300 (2013) (http://dx.doi.org/10.1364/JOSAB.30.002296)
http://hal.archives-ouvertes.fr/hal-00854489
Co/Mo2C mirror as studied by x-ray fluorescence and photoelectron spectroscopies induced by x-ray standing waves
P. Jonnard, K. Le Guen, Y.-Y. Yuan, J.-M. André, S. Mukherjee, A. Giglia, S. Nannarone, N. Mahne, Z.-S. Wang, H.-C. Li, J.-T. Zhu
Proc. SPIE 8550, 85501D (2013) (http://dx.doi.org/10.1117/12.980893)
Determination of the magnetization profile of Co/Mg periodic multilayers by magneto-optic Kerr effect and X-ray magnetic resonant reflectivity
P. Jonnard, K. Le Guen, J.-M. André, R. Delaunay, N. Mahne, A. Giglia, S. Nannarone, A. Verna, Z.-S. Wang, J.-T. Zhu, S.-K. Zhou
J. Phys. Conf. Ser. 417, 012025 (2013) (http://dx.doi.org/10.1088/1742-6596/417/1/012025)
http://hal.archives-ouvertes.fr/hal-00801971 http://fr.arxiv.org/abs/1303.4380
Analyse par la théorie des ondes couplées de la diffraction par des réseaux multicouches dans le domaine X
J.-M. André, K. Le Guen, P. Jonnard
UVX2012, 02001 (2013) (http://dx.doi.org/10.1051/uvx/201302001)
Al/Zr multilayer mirror and its thermal stability for EUV application
Q. Zhong, Z. Zhang, W.-B. Li, J.-T. Zhu, Z.-S. Wang; P. Jonnard, K. Le Guen, Y.-Y. Yuan, J.-M. André, H.-J. Zhou, T.-L. Huo
J. Phys. Conf. Ser. 425, 152010 (2013) (http://10.1088/1742-6596/425/15/152010)
Investigation of the x-ray reflectivity of the Co/Mo2C system upon thermal treatment
Y.-Y. Yuan, K. Le Guen, J.-M. André, Z.-S. Wang, J.-T. Zhu, P. Jonnard
Proc. SPIE 8550, 85501U (2013) (http://dx.doi.org/10.1117/12.980895)
2012
Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications
M.-H. Hu, K. Le Guen, J.-M. André, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, C. Meny, N. Mahne, A. Giglia, S. Nannarone, I. Estève, M. Walls, P. Jonnard
Appl. Phys. A106, 737-745 (2012) (http://dx.doi.org/10.1007/s00339-011-6681-9)
http://hal.archives-ouvertes.fr/hal-00648899 http://arxiv.org/abs/1112.1292
Influence of working gas pressure on the performance of W/Si multilayers
F.-F. Wang, J.-T. Zhu, Q. Zhong, Z.-S. Wang, P. Jonnard, K. Le Guen, J.-M. André, M. Fialin
Chin. Phys. C36, 909-914 (2012) (http://dx.doi.org/10.1088/1674-1137/36/9/021)
An etched multilayer as a dispersive element in a curved-crystal spectrometer: implementation and performance
P. Jonnard, K. Le Guen, J.-M. André, J.-R. Coudevylle, N. Isac
X-Ray Spectrom. 41, 308-312 (2012) (http://dx.doi.org/10.1002/xrs.2398)
http://hal.archives-ouvertes.fr/hal-00725539 http://arXiv.org/abs/1208.6404
Optical and structure performance of the Al/Zr reflection multilayers in the 17–19nm region
Q. Zhong, W.-B Li, Z. Zhang, J.T. Zhu, Q.-S. Huang, H.C. Li, Z.-S. Wang, P. Jonnard, K. Le Guen, J.-M. André, H.-J. Zhou, T.-L. Huo
Opt. Express 20, 10692-10700 (2012) (http://dx.doi.org/10.1364/OE.20.010692)
http://hal.archives-ouvertes.fr/hal-00685910
The chemical characterization and reflectivity of the Al/Zr periodic multilayer
Q. Zhong, Z. Zhang, J.-T. Zhu, Z.-S. Wang, P. Jonnard, K. Le Guen, J.-M. André
Appl. Surf. Sci. 259, 371-375 (2012) (http://dx.doi.org/10.1016/j.apsusc.2012.07.054)
http://hal.archives-ouvertes.fr/hal-00697730
The thermal stability of Al(1%wtSi)/Zr EUV mirrors
Q. Zhong, Z. Zhang, J.-T. Zhu, Z.-S. Wang, H. Chen, P. Jonnard, K. Le Guen, Y.-Y. Yuan, J.-M. André, H.-J. Zhou, T.-L. Hu
Appl. Phys. A109, 133-138 (2012) (http://dx.doi.org/10.1007/s00339-012-7085-1)
The TPLUS project : a table-top tunable parametric UV radiation source
J.-M. André, G. Turk, K. Le Guen, P. Jonnard, F. Delmotte, S. de Rossi, A. Jérôme, A.-L. Coutrot
J. Phys. Conf. Ser. 357, 012039 (2012) (http://dx.doi.org/10.1088/1742-6596/357/1/012039)
http://hal.archives-ouvertes.fr/hal-00748799
2011
Introduction of Zr layers in periodic Mg/Co multilayers
K. Le Guen, M.-H. Hu, J.-M. André, P. Jonnard, S. K. Zhou, H. C. Li, J. T. Zhu, Z. S. Wang, N. Mahne, A. Giglia, S. Nannarone
Appl. Phys. A102, 69-77 (2011) (http://dx.doi.org/10.1007/s00339-010-6093-2)
http://hal.archives-ouvertes.fr/hal-00642789/fr/ http://arxiv.org/abs/1111.4546
Cauchois & Sénémaud Tables of wavelengths of x-ray emission lines and absorption edges
P. Jonnard, C. Bonnelle
X-Ray Spectrom. 40, 12-16 (2011) (http://dx.doi.org/10.1002/xrs.1293)
http://hal.archives-ouvertes.fr/hal-00596480/fr/ http://arxiv.org/abs/1112.1182
Characterization of EUV periodic multilayers
K. Le Guen, M.-H Hu, J.-M. André, P. Jonnard, Z. Wang, J. Zhu, A. Galtayries, C. Meny, E. Meltchakov, C. Hecquet, F. Delmotte
X-Ray Spectrom. 40, 338-342 (2011) (http://dx.doi.org/10.1002/xrs.1350)
http://hal.archives-ouvertes.fr/hal-00642782/fr/
Origin of step-like behavior in Co/Si system
A. Sagdeo, S. Rai, A. K. Srivastava, G. S. Lodha, R. Rawat, K. Le Guen, P. Jonnard
J. Phys. Cond. Matter 23, 246004 (2011) (http://dx.doi.org/10.1088/0953-8984/23/24/246004)
Observation of an asymmetrical effect when introducing Zr in Mg/Co multilayers
K. Le Guen, M.-H. Hu, J.-M. André, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, C. Meny, A. Galtayries, P. Jonnard
Appl. Phys. Lett. 98, 251909 (2011) (http://dx.doi.org/10.1063/1.3601859)
http://hal.archives-ouvertes.fr/hal-00642773/fr/
Molybdenum-silicon aperiodic multilayer broadband polarizer for 13-30 nm wavelength range
M.-Y. Tan, J.-T. Zhu, Z.-S. Wang, K. Le Guen, P. Jonnard, A. Giglia, N. Mahne, S. Nannarone
NIM A654, 588-591 (2011) (http://dx.doi.org/10.1016/j.nima.2011.07.007)
Effective mass of photons in one dimensional photonic crystal
J.-M. André, P. Jonnard
Phys. Scr. 84, 035708 (2011) (http://dx.doi.org/doi:10.1088/0031-8949/84/03/035708)
http://hal.archives-ouvertes.fr/hal-00631235/fr/
DUVEX: an x-ray counting system based on YAG:Ce scintillator
J.-M. André, K. Le Guen, P. Jonnard, Y. Ménesguen
NIM A659, 318-321 (2011) (http://dx.doi.org/10.1016/j.nima.2011.08.010)
http://hal.archives-ouvertes.fr/hal-00637832/fr/
Thermal stability of Mg/Co multilayer with B4C, Mo or Zr diffusion barrier layers
J. T. Zhu, S. K. Zhou, H. Ch. Li, Z. S. Wang, P. Jonnard, K. Le Guen, M.-H. Hu, J.-M. André, H. J. Zhou, T. L. Huo
Opt. Express 19, 21849-21854 (2011) (http://dx.doi.org/10.1364/OE.19.021849)
Contrôle de l’émission spontanée de rayonnement X au moyen d’un cristal photonique mono-dimensionnel
J.-M. André, P. Jonnard
UVX2010, 163-167 (2011) (http://dx.doi.org/10.1051/uvx/2011022)
Some techniques to characterize multilayers and their interfaces
P. Jonnard
Proc. SPIE 7995, 79951T (2011) (http://dx.doi.org/10.1117/12.888172)
Thermal properties, optical and interface characterization of Co/Mg periodic multilayers for the EUV range
M.-H. Hu, K. Le Guen, J.-M. André, P. Jonnard, S. K. Zhou, H. C. Li, J. T. Zhu, Z. S. Wang, N. Mahne, A. Giglia, S. Nannarone
Proc. SPIE 7995, 7995OP (2011) (http://dx.doi.org/10.1117/12.888261)
Introduction of Zr in Mg/Co nanometric periodic multilayers
K. Le Guen, M.-H. Hu, J.-M. André, P. Jonnard, S. K. Zhou, H. C. Li, J. T. Zhu, Z. S. Wang, C. Meny
Proc. SPIE 7995, 799525 (2011) (http://dx.doi.org/10.1117/12.888193)
Optical, chemical, depth and magnetic characterization of Mg/Co-based nanometric periodic multilayers
P. Jonnard, K. Le Guen, M.-H. Hu, J.-M. André, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, N. Mahne, A. Giglia, S. Nannarone, A. Verna, C. Meny, A. Galtayries, M. Walls
Proc. SPIE 8168, 816818 (2011) (http://dx.doi.org/10.1117/12.895316)
DUVEX a versatile EUV-X detector
J.-M. André, K. Le Guen, P. Jonnard, Y. Ménesguen
Proc. SPIE 8167, 816724 (2011) (http://dx.doi.org/10.1117/12.895217)
Electronic structure of Ni-Al interface
Bonnelle, F. Cyrot-Lackmann, P. Jonnard, J. P. Julien, D. Mayou, F. Vergand
Phys. Scr. 38, 100-102 (1988) (http://dx.doi.org/10.1088/0031-8949/38/1/017)
Radiative decay of Al 1s core hole in monocrystalline AlAs
F. Vergand, P. Jonnard, C. Bonnelle
Europhys. Lett. 10, 67-72 (1989) (http://dx.doi.org/10.1209/0295-5075/10/1/012)
Local electronic distribution on Al sites at GaAs/AlAs interface
Jonnard, F. Vergand, C. Bonnelle, C. Deparis, J. Massies
J. Phys. Condensed Matter 3, 3433-3439 (1991) (http://dx.doi.org/10.1088/0953-8984/3/20/005)
Aluminium valence and core excitonic states in GaAs-Ga0.7Al0.3As systems
F. Vergand, P. Jonnard, M. Kefi, C. Bonnelle, C. Deparis, J. Massies
J. Phys. Condensed Matter 5, 1691-1700 (1993) (http://dx.doi.org/10.1088/0953-8984/5/11/009)
Hybridization of Al and O states in a- and g alumina
M. Kefi, P. Jonnard, F. Vergand, C. Bonnelle, E. Gillet
J. Phys. Condensed Matter 5, 8629-8642 (1993) (http://dx.doi.org/10.1088/0953-8984/5/45/016)
Electron energy distributions at AuPd/alumina interfaces
M. Kefi, P. Jonnard, F. Vergand, A. Amamou, C. Bonnelle
J. Phys. D 27, 1952-1958 (1994) (http://dx.doi.org/10.1088/0022-3727/27/9/021)
Instrument for Research on Interfaces and Surfaces (IRIS)
C. Bonnelle, F. Vergand, P. Jonnard, J.-M. André, P. Avila, P. Chargelègue, M.-F. Fontaine, D. Laporte, P. Paquier, A. Ringuenet, B. Rodriguez
Rev. Sci. Instrum. 65, 3466-3471 (1994) (http://dx.doi.org/10.1063/1.1144524)
Correlation between electronic and atomic structures in Ag-Ni multilayers
P. Jonnard, F. Vergand, C. Bonnelle, K. F. Badawi
J. Appl. Phys. 77, 6044-6045 (1995) (http://dx.doi.org/10.1063/1.359191)
Analyse spatial de la taille d’une source X à l’aide d’un spectromètre à cristal convexe
C. Barré, J.-M. André, P. Jonnard, C. Bonnelle
X-Ray Spectrom. 24, 260-266 (1995) (http://dx.doi.org/10.1002/xrs.1300240510)
Characterization of the polyparaphenylene vinylene-chromium interface by internal reflection infra-red and x-ray emission spectroscopies
T. P. Nguyen, P. Jonnard, F. Vergand, P.-F. Staub, M. Lapkowski, V. H. Tran
Synth. Met. 75, 175-179 (1995) (http://dx.doi.org/10.1016/0379-6779(96)80004-X)
Electron trapping in a-alumina observed by electron induced x-ray emission
P. Jonnard, F. Vergand, M. Kefi, C. Bonnelle
J. Appl. Phys. 79, 2909-2912 (1996) (http://dx.doi.org/10.1063/1.361221)
Study of the interface between polyacrylonitrile thin films and a nickel cathode : Ni 3d states analyzed by EXES
P. Jonnard, F. Vergand, P.-F. Staub, C. Bonnelle, G. Deniau, C. Bureau, G. Lécayon
Surf. Interface Anal. 24, 339-344 (1996)
(http://dx.doi.org/10.1002/(SICI)1096-9918(199605)24:5<339::AID-SIA124>3.0.CO;2-Y)
Temperature-dependent sample holder for x-ray spectrometer
P. Jonnard, P. Chargelègue, C. Hombourger, J. Thirion, F. Vergand
Rev. Sci. Instrum. 67, 2417-2418 (1996) (http://dx.doi.org/10.1063/1.1147011)
Study of the metallized poly(phenylene-vinylene) film interface
T. P. Nguyen, M. Lapkowski, P. Jonnard, F. Vergand, P.-F. Staub, C. Bonnelle, V. H. Tran
AIP Conf. Proc. 354, 327-333 (1996) (http://dx.doi.org/10.1063/1.49487)
X-ray emissions in 3d, 4d and 5d ranges for uranium ions
C. Bonnelle, C. Barré, P. Jonnard, G. Giorgi, F. Vergand
Phys. Rev. A55, 3422-3432 (1997) (http://dx.doi.org/10.1103/PhysRevA.55.3422)
Importance of the mixing of valence states on adhesion at solid-solid interfaces
P. Jonnard, F. Vergand, C. Bonnelle
Int. J. Adh. Adh. 17, 263-267 (1997) (http://dx.doi.org/10.1016/S0143-7496(97)00013-4)
Al 3p valence and excitonic states in GaSb/Al0.3Ga0.7Sb and GaAs/Al0.3Ga0.7As heterostructures as a function of growth process
P. Jonnard, F. Vergand, C. Bonnelle, M. Leroux, J. Massies
Phys. Rev. B55, 15727-15734 (1997) (http://dx.doi.org/10.1103/PhysRevB.55.15727)
Study of the adhesion between a-CH thin films and TA6V substrates by electron-induced x-ray emission spectroscopy (EXES)
P. Jonnard, C. Tixier, J. Desmaison, C. Hombourger, C. Bonnelle
Thin Solid Films 306, 119-129 (1997) (http://dx.doi.org/10.1016/S0040-6090(97)00281-2)
Depth profiles of Al/Mn/Si multilayers
C. Hombourger, P. Jonnard, C. Bonnelle, E. Beauprez, M. Spirckel, B. Feltz, D. Boutard, J.-P. Gallien
Microsc. Microanal. Microstruct. 8, 287-300 (1997) (http://dx.doi.org/10.1051/mmm:1997122)
Physicochemical interaction and atomic structure at Cu-MgO interface
P. Jonnard, C. Hombourger, F. Vergand, C. Bonnelle, A. Renou, A. Assaban, E. Gillet, M. Gillet
Microsc. Microanal. Microstruct. 8, 325-334 (1997) (http://dx.doi.org/10.1051/mmm:1997125)
IntriX: a numerical model for electron probe analysis at high depth resolution. Part II—tests and confrontation with experiments
P.-F. Staub, P. Jonnard, F. Vergand, J. Thirion, C. Bonnelle
X-Ray Spectrom. 27, 58-66 (1998)
(http://dx.doi.org/10.1002/(SICI)1097-4539(199801/02)27:1<58::AID-XRS248>3.0.CO;2-4)
Comparison of Cu-MgO interfaces studied by EXES and XPS
P. Jonnard, C. Hombourger, F. Vergand, C. Bonnelle, B. Ealet, A. Renou, E. Gillet
Surf. Rev. Lett. 5, 369-373 (1998) (http://dx.doi.org/10.1142/S0218625X98000682)
Electron distribution of MgO studied by x-ray emission
P. Jonnard, F. Vergand, C. Bonnelle, E. Orgaz, M. Gupta
Phys. Rev. B57, 12111-12118 (1998) (http://dx.doi.org/10.1103/PhysRevB.57.12111)
Adhesion improvement of Poly(Phenylene-Vinylene) substrates induced by Argon-Oxygen plasma treatment
T. P. Nguyen, A. Lahmar, P. Jonnard
J. Adh. 66, 303-317 (1998) (http://dx.doi.org/10.1080/00218469808009971)
Characterization method of the valence states : application to dielectrics and metal-dielectric interfaces
P. Jonnard
J. Phys IV (Fr) 8, Pr9-33-42 (1998) (http://dx.doi.org/10.1051/jp4:1998904)
Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements
C. Hombourger, P. Jonnard, J.-M. André, J.-P. Chauvineau
X-Ray Spectrom. 28, 163-167 (1999)
(http://dx.doi.org/10.1002/(SICI)1097-4539(199905/06)28:3<163::AID-XRS331>3.0.CO;2-Z)
Insulator gap states at the Cu/MgO (001) interface studied by x-ray emission spectroscopy
P. Jonnard, C. Bonnelle
Surf. Sci. 436, L724-L728 (1999) (http://dx.doi.org/10.1016/S0039-6028(99)00703-7)
Investigation of a Mo/SiO2 interface by electron-induced x-ray emission spectroscopy
P. Jonnard, C. Bonnelle, K. Danaie, A. Bosseboeuf, E. Beauprez
Surf. Interface Anal. 29, 255-259 (2000)
(http://dx.doi.org/10.1002/(SICI)1096-9918(200004)29:4<255::AID-SIA736>3.0.CO;2-D)
F and F+ centres in a-Al2O3 by optical and x-ray cathodoluminescence
P. Jonnard, C. Bonnelle, G. Blaise, G. Rémond, C. Rocques-Carmes
J. Appl. Phys. 88, 6413-6417 (2000) (http://dx.doi.org/10.1063/1.1324697)
Effect of argon etching on alumina surfaces and on Pt/alumina interfacesP. Jonnard, P. Kayser
Appl. Surf. Sci. 182, 133-141 (2001) (http://dx.doi.org/10.1016/S0169-4332(01)00470-6)
Experimental and theoretical K x-ray spectra of manganese
P. Jonnard, G. Giorgi, C. Bonnelle
Phys. Rev. A65, 032507 (2002) (6 pages) (http://dx.doi.org/10.1103/PhysRevA.65.032507)
Adhesion properties of aluminium-metallized/ammonia plasma-treated polypropylene. Spectroscopic analysis (XPS, EXES) of the aluminium/polypropylene interface
J. Kurdi, H. Ardelean, P. Marcus, P. Jonnard, F. Arefi-Khonsari
Appl. Surf. Sci. 189, 119-128 (2002) (http://dx.doi.org/10.1016/S0169-4332(02)00017-X)
Study of the NiTi/SiO2 interface : Analysis of the electronic distributions
I. Jarrige, P. Jonnard, N. Frantz-Rodriguez, K. Danaie, A. Bosseboeuf
Surf. Interf. Anal. 34, 694-697 (2002) (http://dx.doi.org/10.1002/sia.1390)
Modulation of x-ray line intensity emitted by a periodic structure under electron excitation
P. Jonnard, J.-M. André, C. Bonnelle, F. Bridou, B. Pardo
Appl. Phys. Lett. 81, 1524-1526 (2002) (http://dx.doi.org/10.1063/1.1502189)
http://hal.archives-ouvertes.fr/hal-00903535
Thickness determination of very thin SiO2 films on Si by electron-induced x-ray emission spectroscopy
C. Hombourger, P. Jonnard, E. O. Filatova, V. Lukyanov
Appl. Phys. Lett. 81, 2740-2742 (2002) (http://dx.doi.org/10.1063/1.1511281)
Emissions X K du manganèse : comparaison entre les spectres du métal et d’une source de 55Fe
C. Bonnelle, P. Jonnard, M.-M. Bé, M.-C. Lépy
Bull. Bureau National de Métrologie 120, 7-16 (2002)
http://hal.archives-ouvertes.fr/hal-01125727
Physico-chemistry and morphology of silicon surface during the first stage of alumina deposition
P. Jonnard, J. Desmaison, H. Hidalgo, F. Rossignol, C. Tixier, P. Tristant
Appl. Surf. Sci. 212-213, 674-678 (2003) (http://dx.doi.org/10.1016/S0169-4332(03)00021-7)
Spectroscopic studies of TM/Si and TM/SiO2 interfaces
I. Jarrige, P. Jonnard, P. Holliger, T. P. Nguyen
Appl. Surf. Sci. 212-213, 689-693 (2003) (http://dx.doi.org/10.1016/S0169-4332(03)00071-0)
Physico-chemical environment of Al impurity atoms in amorphous silica
P. Jonnard, J.-P. Morreeuw, H. Bercegol
Eur. J. Phys. Appl. Phys. 21, 147-149 (2003) (http://dx.doi.org/10.1051/epjap:2002109)
http://hal.archives-ouvertes.fr/hal-01346820
Microstructural and physicochemical study of the buried Fe/AlGaAs (001) interface by transmission electron microscopy and x-ray emission spectroscopy
F. Monteverde, P. Jonnard, S. Harel, A. Michel, J.-P. Eymery
Surf. Interf. Anal. 35, 246-250 (2003) (http://dx.doi.org/10.1002/sia1521)
Bragg amplification of the Si Ka line emitted from a Mo/Si multilayer irradiated by an electron beam
P. Jonnard, J.-M. André, C. Bonnelle, F. Bridou, B. Pardo
AIP Conf. Proc. 652, 99-102 (2003) (http://dx.doi.org/10.1063/1.1536365)
Amplification de Bragg de la raie Si Ka émise par une multicouche Mo/Si irradiée par un faisceau d’électrons : vers un laser X à rétroaction distribuée?
P. Jonnard, J.-M. André, C. Bonnelle, F. Bridou, B. Pardo
J. Phys. IV (Fr) 108, 211-214 (2003) (http://dx.doi.org/10.1051/jp4:20030630)
From diffusion processes to adherence properties in NiTi/Si and NiTi/SiO2 systems
I. Jarrige, P. Holliger, T. P. Nguyen, J. Ip, P. Jonnard
Microelectronic Eng. 70, 251-254 (2003) (http://dx.doi.org/10.1016/S0167-9317(03)00374-5)
Depth profiling of P shallow implants in silicon by Electron-induced X-ray Emission SpectrometryC. Hombourger, P. Jonnard, C. Bonnelle, P.-F. Staub
Eur. Phys. J. Appl. Phys. 24, 115-119 (2003) (http://dx.doi.org/10.1051/epjap:2003078)
Soft x-ray Kossel structures from W/C multilayers under various electron ionization conditions
P. Jonnard, J.-M. André, C. Bonnelle, F. Bridou, B. Pardo
Phys. Rev. A 68, 032505 (2003) (7 pages) (http://dx.doi.org/10.1103/PhysRevA.68.032505)
SOLEX : une source X monochromatique accordable entre 1 et 20 keV pour la métrologie
C. Bonnelle, M.-C. Lépy, J.-M. André, A. Avila, L. Ferreux, P. Jonnard, D. Laporte, J. Plagnard, J.-C. Protas, H. Ringuenet
Bull. Bureau National de Métrologie 122, 11-17 (2003)
http://hal.archives-ouvertes.fr/hal-01179262
Diffusion processes in NiTi/Si, NiTi/SiO2 and NiTi/Si3N4 systems under annealing
I. Jarrige, P. Jonnard, P. Holliger
Thin Solid Films 458, 314-321 (2004) (http://dx.doi.org/10.1016/j.tsf.2003.12.039)
SOLEX : a tunable monochromatic x-ray source in the 1 – 20 keV energy range for metrology
C. Bonnelle, P. Jonnard, J.-M. André, A. Avila, D. Laporte, H. Ringuenet, M.-C. Lépy, J. Plagnard, L. Ferreux, J.-C. Protas
Nucl. Instrum. Meth. Phys. Res. A516, 594-601 (2004)
(http://dx.doi.org/10.1016/j.nima.2003.09.031) http://hal.archives-ouvertes.fr/hal-01179258
Etude d’un empilement multicouche périodique Mo/Si par spectroscopie d’émission X et par réflectométrie X
P. Jonnard, J.-M. André, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet
J. Phys. IV 118, 231-236 (2004) (http://dx.doi.org/10.1051/jp4:2004118027)
Radiation emitted by an oscillating dipole embedded in a periodic stratified structure: a direct matrix analysis
J.-M. André, P. Jonnard, B. Pardo
Phys. Rev. A 70, 012503 (2004) (6 pages) (http://dx.doi.org/10.1103/PhysRevA.70.012503)
Surface density enhancement of gold in silica film under laser irradiation at 355 nm
P. Jonnard, G. Dufour, J.-L. Rullier, J.-P. Morreeuw, J. T. Donohue
Appl. Phys. Lett. 85, 591-593 (2004) (http://dx.doi.org/10.1063/1.1777391)
Physico-chemical state of the silicon atoms in the HfO2/SiO2/Si system
P. Jonnard, I. Jarrige, O. Renault, J.-F. Damlencourt, F. Martin
Surf. Sci. 572, 396-400 (2004) (http://dx.doi.org/10.1016/j.susc.2004.09.014)
Electronic structure of wurtzite and zinc-blende AlN
P. Jonnard, N. Capron-Joubert, F. Semond, J. Massies, E. Martinez-Guerrero, H. Mariette
Eur. Phys. J. B42, 351-359 (2004) (http://dx.doi.org/10.1140/epjb/e2004-00390-7)
http://hal.ccsd.cnrs.fr/view/ccsd-00000932/fr/ http://arxiv.org/abs/cond-mat/0312245
La/B4C small period multilayer interferential mirrors for the analysis of boron
J.-M. André, P. Jonnard, C. Michaelsen, J. Wiesmann, M.-F. Ravet, F. Delmotte, F. Bridou, E. Filatova
X-Ray Spectrom. 34, 203-206 (2005) (http://dx.doi.org/10.1002/xrs.793)
http://hal.archives-ouvertes.fr/hal-01232846
Control of the reactivity at a metal/silica interface
I. Jarrige, P. Jonnard, I. Vickridge
Appl. Phys. Lett. 86, 204105 (2005) (3 pages) (http://dx.doi.org/10.1063/1.1931821)
X-ray spectroscopy study of electronic structure of laser-irradiated gold nanoparticles in a silica film
P. Jonnard, H. Bercegol, L. Lamaignère, J.-P. Morreeuw, J.-L. Rullier, E. Cottancin, M. Pellarin
J. Appl. Phys 97, 064306 (2005) (5 pages) (http://dx.doi.org/10.1063/1.1858877)
Satellite lines induced by electrons of near-threshold energy in the x-ray emission band spectra of 3d, 4d, and 5d transition metals
P. Jonnard, I. Jarrige, C. Bonnelle
Phys. Rev. B 71, 155107 (2005) (12 pages) (http://dx.doi.org/10.1103/PhysRevB.71.155107)
http://hal.ccsd.cnrs.fr/ccsd-00002265 http://hal.ccsd.cnrs.fr/ccsd-00002267
Lamellar multilayer amplitude grating as soft-x-ray Bragg monochromator
R. Benbalagh, J.-M. André, R. Barchewitz, P. Jonnard, G. Julié, L. Molard, G. Rolland, C. Rémond, P. Troussel, R. Marmoret, E. O. Filatova
Nucl. Instrum. Meth. Phys. Res. A541, 590-597 (2005)
(http://dx.doi.org/10.1016/j.nima.2004.12.015)
MONOX : a characterization tool for the X-UV range
J.-M. André, A. Avila, R. Barchewitz, R. Benbalagh, R. Delaunay, D. Druart, P. Jonnard, H. Ringuenet
Eur. Phys. J. Appl. Phys. 31, 147-152 (2005) (http://dx.doi.org/10.1051/epjap:2005047)
http://hal.archives-ouvertes.fr/hal-01179271
Physico-chemical and x-ray optical characterizations of a Mo/Si multilayer interferential mirror upon annealing
P. Jonnard, I. Jarrige, R. Benbalagh, H. Maury, J.-M. André, Z. Dankhazi, G. Rolland
Surf. Sci. 589, 164-172 (2005) (http://dx.doi.org/10.1016/j.susc.2005.05.058)
X-ray Raman scattering with Bragg diffraction in a La-based superlattice
J.-M. André, P. Jonnard, C. Bonnelle, E. O. Filatova, C. Michaelsen, J. Wiesmann
Opt. Commun. 255, 267-271 (2005) (http://dx.doi.org/10.1016/j.optcom.2005.06.042)
http://hal.ccsd.cnrs.fr/ccsd-00004911 http://arxiv.org/abs/cond-mat/0505381
Control of the interfacial reactivity in the Ni/Si system
I. Jarrige, R. Delaunay, P. Jonnard
Sol. State Commun. 136, 11-15 (2005) (http://dx.doi.org/10.1016/j.ssc.2005.06.031)
Characterization of a HfO2/SiO2/Si system by x-ray reflection and x-ray emission spectrometries
J.-M. André, E. Filatova, O. Renault, J.-F. Damlencourt, F. Martin, P. Jonnard
Surf. Interf. Anal. 38, 777-780 (2006) (http://dx.doi.org/10.1002/sia.2133)
Analysis of a B4C/Mo/Si multilayer interferential mirror by SIMS : influence of the sputtering ion
H. Maury, P. Holliger, B. Farès, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet, J.-M. André, P. Jonnard
Surf. Interf. Anal. 38, 781-783 (2006) (http://dx.doi.org/10.1002/sia.2154)
Physico-chemical study of the interfaces of Mo/Si multilayer interferential mirrors : correlation with the optical properties
H. Maury, J.-M. André, J. Gautier, F. Bridou, F. Delmotte, M.-F. Ravet, P.Holliger, P. Jonnard
Surf. Interf. Anal. 38, 744-747 (2006) (http://dx.doi.org/10.1002/sia.2248)
X-ray reflection spectroscopy of the HfO2/SiO2/Si system in the region of the O-K absorption edge
E. O. Filatova, P. Jonnard, J.-M. André
Thin Solid Films 500, 219-223 (2006) (http://dx.doi.org/10.1016/j.tsf.2005.11.008)
http://hal.ccsd.cnrs.fr/ccsd-00004944
Non destructive x-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers
H. Maury, P. Jonnard, J.-M. André, J. Gautier, M. Roulliay, F. Bridou, F. Delmotte, M.-F. Ravet, A. Jérome, P. Holliger
Thin Solid Films 514, 278-286 (2006) (http://dx.doi.org/10.1016/j.tsf.2006.02.073)
Ultrasoft x-ray reflection and emission spectroscopic analysis of Al2O3/Si structure synthesized by ALD method
E. O. Filatova, E. Yu, Taracheva, A. A. Sokolov, S.V. Bukin, A. S. Shulakov, P. Jonnard, J.-M. André, V. E. Drozd
X-Ray Spectrom. 35, 359-364 (2006) (http://dx.doi.org/10.1002/xrs.919)
Diffusion du rayonnement X monochromatique par une structure multicouche périodique La/B4C au voisinage du seuil La 4d
J.-M. André, P. Jonnard, C. Bonnelle, E. O. Filatova
J. Phys. IV 138, 111–117 (2006) (http://dx.doi.org/10.1051/jp4:2006138014)
http://hal.archives-ouvertes.fr/hal-01233235
Multilayer interfacial mirrors as components for soft-x-ray WDS monochromators and tunable radiation sources
J.-M. André, P. Jonnard, R. Benbalagh
X-Ray Spectrom. 36, 62-65 (2007) (http://dx.doi.org/10.1002/xrs.933)
Quantitative TEM characterizations of La/B4C and Mo/B4C ultrathin multilayer gratings by the geometric phase method
M. Häussler, E. Spiecker, W. Jäger, M. Störmer, R. Bormann, C. Michaelsen, J. Wiesmann, G. Zwicker, R. Benbalagh, J.-M. André, P. Jonnard
Microelectronic Eng. 84, 454-459 (2007) (http://dx.doi.org/10.1016/j.mee.2006.10.060)
Wavelength dispersive spectroscopy analysis at high spectral resolution : application to the study of Mo/Si multilayers
P. Jonnard, H. Maury, J.-M. André
X-Ray Spectrom. 36, 72-75 (2007) (http://dx.doi.org/10.1002/xrs.940)
Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive x-ray techniques
H. Maury, P. Jonnard, J.-M. André, J. Gautier, F. Bridou, F. Delmotte, M.-F. Ravet
Surf. Sci. 601, 2315-2322 (2007) (http://dx.doi.org/10.1016/j.susc.2007.03.044)
X-ray interface analysis of aperiodic Mo/Si multilayers
K. Le Guen, H. Maury, J.-M. André, H. Wang, J. Zhu, Z. Wang, P. Jonnard
Appl. Surf. Sci. 253, 8443-8446 (2007) (http://dx.doi.org/10.1016/j.apsusc.2007.04.033)
X-ray scattering from etched and coated multilayer gratings
M. Störmer, J.-M. André, C. Michaelsen, R. Benbalagh, P. Jonnard
J. Phys. D40, 4253-4258 (2007) (http://dx.doi.org/10.1088/0022-3727/40/14/022)
X-ray spectroscopic application of Cr/Sc periodic multilayers
K. Le Guen, H. Maury, J.-M. André, P. Jonnard, A. Hardouin, F. Delmotte, M.-F. Ravet
Appl. Phys. Lett. 91, 234104 (2007) (http://dx.doi.org/10.1063/1.2821379)
http://hal.archives-ouvertes.fr/hal-00575878/
Interdiffusion effects in as-deposited Al/Ni polycrystalline multilayers
M. Salou, S. Rioual, J. Ben Youssef, D. Dekadjevi, S. Pogossian, P. Jonnard, K. Le Guen, G. Gamblin, B. Lépine, B. Rouvellou
Surf. Interf. Anal. 40, 1318-1321 (2008) (http://dx.doi.org/10.1002/sia.2896)
Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers
H. Maury, P. Jonnard, K. Le Guen, J.-M. André, Z. Wang, J. Zhu, J. Dong, Z. Zhang, F. Bridou, F. Delmotte, C. Hecquet, N. Mahne, A. Giglia, S. Nannarone
Eur. Phys. J. B64, 193-199 (2008) (http://dx.doi.org/10.1140/epjb/e2008-00290-x)
http://hal.archives-ouvertes.fr/hal-00256010/fr/
Electronic structure of Ni and Mo silicides investigated by x-ray emission spectroscopy and density functional theory
I. Jarrige, N. Capron, P. Jonnard
Phys. Rev. B79, 035117 (2009) (http://dx.doi.org/10.1103/PhysRevB.79.035117)
http://hal.archives-ouvertes.fr/hal-00844567
Characterization of Al and Mg alloys from their emission band
P. Jonnard, K. Le Guen, R. Gauvin, J.-F. Le Berre
Microscopy & Microanalysis 15, 36-45 (2009) (http://dx.doi.org/10.1017/S1431927609090060)
http://hal.archives-ouvertes.fr/hal-00844561 https://arxiv.org/abs/1307.3959
Spectroscopic study of interfaces in Al/Ni periodic multilayers
K. Le Guen, G. Gamblin, J.-M. André, P. Jonnard, M. Salou, J. Ben Youssef, S. Rioual, B. Rouvellou
Eur. Phys. J. Appl. Phys. 45, 20502 (2009) (4 pages) (http://dx.doi.org/10.1051/epjap:2008189)
http://hal.archives-ouvertes.fr/hal-00844545 https://arxiv.org/abs/1307.3958
High-resolution x-ray analysis with multilayer gratings
P. Jonnard, K. Le Guen, J.-M. André
X-Ray Spectrom. 38, 117-120 (2009) (http://dx.doi.org/10.1002/xrs.1128)
http://hal.archives-ouvertes.fr/hal-00808363 https://arxiv.org/abs/1304.1777
Analysis of Mo/Si multilayers: influence of the Mo thickness
H. Maury, J.-M. André, K. Le Guen, N. Mahne, A. Giglia, S. Nannarone, F. Bridou, F. Delmotte, P. Jonnard
Surf. Sci. 603, 407-411 (2009) (http://dx.doi.org/10.1016/j.susc.2008.12.002)
http://hal.archives-ouvertes.fr/hal-00761558 https://arxiv.org/abs/1212.1258
Stokes reciprocity equations and density of modes for absorbing stratified media
J.-M. André, P. Jonnard
J. Mod. Opt. 56, 1562-1571 (2009) (http://dx.doi.org/10.1080/09500340903184337
J. Mod. Opt. 56, 2384-2386 (2009) (http://dx.doi.org/10.1080/09500340903470074)
X-ray spontaneous emission control by 1-dimensional photonic bandgap structure
J.-M. André, P. Jonnard
Eur. Phys. J. D57, 411-418 (2010) (http://dx.doi.org/10.1140/epjd/e2010-00050-7)
http://hal.archives-ouvertes.fr/hal-00596495/fr/
Interfacial properties and characterization of Sc/Si multilayers
T. N. Shendruk, A. Moeves, E. Z. Kurmaev, P. Ochin, H. Maury, J.-M. André, K. Le Guen, P. Jonnard
Thin Solid Films 518, 3808-3812 (2010) (http://dx.doi.org/10.1016/j.tsf.2010.01.036)
Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach
A. Galtayries, M.-H. Hu, K. Le Guen, J.-M. André, P. Jonnard, E. Meltchakov, C. Hecquet, F. Delmotte
Surf. Interf. Anal. 42, 653-657 (2010) (http://dx.doi.org/10.1002/sia.3393)
Development and interfacial characterization of Co/Mg periodic multilayers in the EUV range
K. Le Guen, M.-H. Hu, J.-M. André, P. Jonnard, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, C. Meny
J. Phys. Chem. C114, 6484-6490 (2010) (http://dx.doi.org/10.1021/jp911119z)
http://hal.archives-ouvertes.fr/hal-00661047
Effect of B4C diffusion barriers on the thermal stability of Sc/Si periodic multilayers
P. Jonnard, H. Maury, K. Le Guen, J.-M. André, N. Mahne, S. Nannarone, F. Bridou
Surf. Sci. 604, 1015-1021 (2010) (http://dx.doi.org/10.1016/j.susc.2010.03.012)
http://hal.archives-ouvertes.fr/hal-00661057
Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength
J. Zhu, S. Zhou, H. Li, Q. Huang, Z. Wang, K. Le Guen, M.-H. Hu, J.-M. André, P. Jonnard
Appl. Opt. 49, 3922-3925 (2010) (http://dx.doi.org/10.1364/AO.49.003922)
Surface dynamic at the early stage of Al2O3 films growth on rough substrates
E. O. Filatova, L. Peverini, E. Ziegler, I. V. Kozhevnikov, P. Jonnard, J.-M. André
J. Phys. Cond. Mat. 22, 345003 (2010) (8 pages) (http://dx.doi.org/10.1088/0953-8984/22/34/345003)
Dynamic of charge trapping in electron-irradiated alumina
C. Bonnelle, P. Jonnard
Phys. Rev. B82, 075132 (2010) (8 pages) (http://dx.doi.org/10.1103/PhysRevB.82.075132)
http://hal.archives-ouvertes.fr/hal-00596486/fr/
On the Kramers-Kronig transform with logarithmic kernel for the reflection phase in the Drude model
J.-M. André, K. Le Guen, P. Jonnard, N. Mahne, A. Giglia, S. Nannarone
J. Mod. Opt. 57, 1504 (2010) (http://dx.doi.org/10.1080/09500340.2010.506015)
http://hal.archives-ouvertes.fr/hal-00643271/fr/ http://arxiv.org/abs/1111.5139
Structural properties of Al/Mo/SiC multilayers with high reflectivity for extreme ultraviolet light
M.-H. Hu, K. Le Guen, J.-M. André, P. Jonnard, E. Meltchakov, F. Delmotte, A. Galtayries
Optics Express 18, 20019-20028 (2010) (http://dx.doi.org/10.1364/OE.18.020019)
http://hal-iogs.archives-ouvertes.fr/hal-00557554