04/12/2020
Nous avons publié un nouvel article dans la revue Analytical Chemistry.
We publish a new paper in Analytical Chemistry.
Characterization of the chemical composition of uranium microparticles with irregular shapes using standardless electron probe microanalysis and micro-Raman spectrometry
M. Essani, E. Brackx, F. Pointurier, F. Berthy, E. Excoffier, P. Jonnard
Anal. Chem. 92, 8435-8443 (2020) (https://doi.org/10.1021/acs.analchem.0c01124)
https://hal.archives-ouvertes.fr/hal-03039927
29/10/2020
Laboratory grazing-incidence X-ray fluorescence spectroscopy as an analytical tool for the investigation of sub-nanometer CrSc multilayer water window optics
V. Szwedowski-Rammert, P. Hönicke, M.-Y. Wu, U. Waldschläger, A Gross, J. Baumann, G. Götzke, F. Delmotte, E. Meltchakov, B. Kanngießer, P. Jonnard, I. Mantouvalou
Spectrochim. Acta B174, 105995 (2020) (https://doi.org/10.1016/j.sab.2020.105995)
https://hal.archives-ouvertes.fr/hal-0298288306/10/2020
En collaboration avec les collègues de l'Institute for Physics of Microstructures of the Russian Academy of Sciences à Nijni Novgorod et de la ligne de lumière synchrotron BEAR/ELETTRA à Trieste, nous avons mesuré la réflectivité d'une multicouche périodique optimisée pour le domaine spectral de l'émission K du lithium.
In collaboration with colleagues of the Institute for Physics of Microstructures of the Russian Academy of Sciences in Nijni Novgorod and of the synchrotron beamline BEAR/ELETTRA in Trieste, we have measured the reflectivity of a periodic multilayer optimized for the spectral range of the lithium K emission.
27/06/2020
Interdiffusion behaviors observation in TiN/ZrOxNy bilayer by XAS and ToF-SIMS
Y.-Y. Yuan, P. Jonnard, K. Le Guen, B.-Y. Zhang, A. Galtayries, A. Giglia, Y.-C. Tu, C. Yan, R. Lan, R. Liu
Appl. Surf. Sci. 528, 146968 (2020) (https://doi.org/10.1016/j.apsusc.2020.146968)
https://hal.archives-ouvertes.fr/hal-02882706v1
18/05/2020
Structure and optical properties of CrOxNy films with composition modulation
Y.-Y. Yuan, B.-Y. Zhang, J. Sun, P. Jonnard, K. Le Guen, Y.-C. Tu, C. Yan, R. Lan
Surface Engineering 36, 411-417 (2020) (https://doi.org/10.1080/02670844.2019.1656356)
03/02/2020
Interfaces between nanometer thin films studied by x-ray standing waves in grazing incidence and grazing exit modes
P. Jonnard
cliquez ici pour télécharger le résumé / Click here to download the abstract
Delayed in October/November owing to the coronavirus crisis
28/01/2020
X-ray emission from layered media irradiated by an x-ray free-electron laser
O. Peyrusse, P. Jonnard, K. Le Guen, J.-M. André
Phys. Rev. A101, 013818 (2020) (https://doi.org/10.1103/PhysRevA.101.013818)
17/01/2020
Nous recevrons pour un séminaire / We will receive for a seminar
Yves Ménesguen
CEA-LIST – Centre de Saclay, Laboratoire National Henri Becquerel
CASTOR, un instrument de caractérisation de couches minces par XRR-GIXRF à SOLEIL
le mercredi 5 février 2020 à 14h
salle 121 couloir 43-44
télécharger l'annonce / download the flyer
14/01/2020
Nous proposons une communication aux Journées Surface et Interfaces, Paris, 22-24 janvier 2020 (https://jsi2020.sciencesconf.org/)
Guide d'ondes analysé par PIXE en mode Kossel
P. Jonnard, J.-P. Zhang, K. Le Guen, R. Delaunay, I. Vickridge, E. Briand, D. Schmaus